Knotter; Dirk Marteen
Patent Applications and Registrations
Patent applications and USPTO patent grants for Knotter; Dirk Marteen.The latest application filed is for "etching with improved control of critical feature dimensions at the bottom of thick layers".
- Knotter; Dirk Marteen - Nijmegen NL
| Patent | Date |
|---|---|
| Etching with improved control of critical feature dimensions at the bottom of thick layers Grant 8,282,845 - Knotter , et al. October 9, 2 | 2012-10-09 |
| Etching with Improved Control of Critical Feature Dimensions at the Bottom of Thick Layers App 20090298293 - Knotter; Dirk Marteen ; et al. | 2009-12-03 |
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