Knippelmeyer; Rainer

Patent Applications and Registrations

Patent applications and USPTO patent grants for Knippelmeyer; Rainer.The latest application filed is for "objective lens arrangement usable in particle-optical systems".

Company Profile

8.39.41

Knippelmeyer; Rainer - Groton MA
KNIPPELMEYER; Rainer - Herrsching am Ammersee DE
Knippelmeyer; Rainer - Milpitas CA
Knippelmeyer; Rainer - Utting am Ammersee DE
Knippelmeyer; Rainer - Herrsching am Ammerse DE
Knippelmeyer; Rainer - Munich N/A DE
Knippelmeyer; Rainer - Aalen DE
Knippelmeyer; Rainer - Muenchen DE
Knippelmeyer; Rainer - Winchester MA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Field curvature correction for multi-beam inspection systems Grant 11,302,511 - Brodie , et al. April 12, 2	2022-04-12
Method and system for charged particle microscopy with improved image beam stabilization and interrogation Grant 11,120,969 - Masnaghetti , et al. September 14, 2	2021-09-14
Method and system for focus adjustment of a multi-beam scanning electron microscopy system Grant 10,861,671 - Masnaghetti , et al. December 8, 2	2020-12-08
Objective Lens Arrangement Usable In Particle-optical Systems App 20200243296 - KNIPPELMEYER; Rainer ; et al.	2020-07-30
Method and System for Charged Particle Microscopy with Improved Image Beam Stabilization and Interrogation App 20200227232 - Masnaghetti; Doug K. ; et al.	2020-07-16
Method and system for charged particle microscopy with improved image beam stabilization and interrogation Grant 10,643,819 - Masnaghetti , et al.	2020-05-05
Objective lens arrangement usable in particle-optical systems Grant 10,622,184 - Knippelmeyer , et al.	2020-04-14
Charged particle beam system and method of operating the same Grant 10,541,112 - Schubert , et al. Ja	2020-01-21
Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Grant 10,504,681 - Knippelmeyer , et al. Dec	2019-12-10
Backscattered electrons (BSE) imaging using multi-beam tools Grant 10,460,905 - McCord , et al. Oc	2019-10-29
Method and system for noise mitigation in a multi-beam scanning electron microscopy system Grant 10,366,862 - Masnaghetti , et al. July 30, 2	2019-07-30
Charged particle inspection method and charged particle system Grant 10,354,831 - Kemen , et al. July 16, 2	2019-07-16
Method and system for focus adjustment of a multi-beam scanning electron microscopy system Grant 10,325,753 - Masnaghetti , et al.	2019-06-18
Method and System for Focus Adjustment of a Multi-Beam Scanning Electron Microscopy System App 20190172675 - Masnaghetti; Doug K. ; et al.	2019-06-06
Charged Particle Beam System And Method Of Operating The Same App 20190066974 - SCHUBERT; Stefan ; et al.	2019-02-28
Multi-beam dark field imaging Grant 10,192,716 - Masnaghetti , et al. Ja	2019-01-29
Charged particle beam system and method of operating the same Grant 10,121,635 - Schubert , et al. November 6, 2	2018-11-06
Objective Lens Arrangement Usable In Particle-optical Systems App 20170294287 - KNIPPELMEYER; Rainer ; et al.	2017-10-12
Particle-optical Systems And Arrangements And Particle-optical Components For Such Systems And Arrangements App 20170287674 - KNIPPELMEYER; Rainer ; et al.	2017-10-05
Field Curvature Correction for Multi-Beam Inspection Systems App 20170229279 - Brodie; Alan ; et al.	2017-08-10
Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Grant 9,673,024 - Knippelmeyer , et al. June 6, 2	2017-06-06
Method and System for Focus Adjustment of a Multi-Beam Scanning Electron Microscopy System App 20170084424 - Masnaghetti; Doug K. ; et al.	2017-03-23
Method and System for Noise Mitigation in a Multi-Beam Scanning Electron Microscopy System App 20170084423 - Masnaghetti; Doug K. ; et al.	2017-03-23
Multi-Beam Dark Field Imaging App 20170084422 - Masnaghetti; Doug K. ; et al.	2017-03-23
Backscattered Electrons (BSE) Imaging Using Multi-Beam Tools App 20170084421 - McCord; Mark A. ; et al.	2017-03-23
Method and System for Charged Particle Microscopy with Improved Image Beam Stabilization and Interrogation App 20160372304 - Masnaghetti; Doug K. ; et al.	2016-12-22
Charged Particle Beam System And Method Of Operating The Same App 20160247663 - SCHUBERT; Stefan ; et al.	2016-08-25
Charged Particle Inspection Method And Charged Particle System App 20160240344 - KEMEN; Thomas ; et al.	2016-08-18
Objective Lens Arrangement Usable In Particle-optical Systems App 20160181054 - KNIPPELMEYER; Rainer ; et al.	2016-06-23
Charged particle detection system and multi-beamlet inspection system Grant 9,336,981 - Knippelmeyer May 10, 2	2016-05-10
Charged particle inspection method and charged particle system Grant 9,324,537 - Kemen , et al. April 26, 2	2016-04-26
Particle-optical Systems And Arrangements And Particle-optical Components For Such Systems And Arrangements App 20160111251 - KNIPPELMEYER; Rainer ; et al.	2016-04-21
Charged particle multi-beam inspection system and method of operating the same Grant 9,263,233 - Zeidler , et al. February 16, 2	2016-02-16
Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Grant 9,224,576 - Knippelmeyer , et al. December 29, 2	2015-12-29
Charged Particle Multi-beam Inspection System And Method Of Operating The Same App 20150090879 - Zeidler; Dirk ; et al.	2015-04-02
Charged Particle Inspection Method And Charged Particle System App 20150008331 - KEMEN; Thomas ; et al.	2015-01-08
Reducing particle implantation Grant 8,907,277 - Knippelmeyer , et al. December 9, 2	2014-12-09
Particle-Optical Systems and Arrangements and Particle-Optical Components for such Systems and Arrangements App 20140158902 - Knippelmeyer; Rainer ; et al.	2014-06-12
Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Grant 8,637,834 - Knippelmeyer , et al. January 28, 2	2014-01-28
Cross-section systems and methods Grant 8,384,029 - Knippelmeyer , et al. February 26, 2	2013-02-26
Charged Particle Detection System and Multi-Beamlet Inspection System App 20130032729 - Knippelmeyer; Rainer	2013-02-07
Repairing defects Grant 8,334,701 - Knippelmeyer , et al. December 18, 2	2012-12-18
Particle-Optical Systems and Arrangements and Particle-Optical Components for such Systems and Arrangements App 20120104252 - KNIPPELMEYER; Rainer ; et al.	2012-05-03
Cross-section Systems And Methods App 20120085906 - Knippelmeyer; Rainer ; et al.	2012-04-12
Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Grant 8,097,847 - Knippelmeyer , et al. January 17, 2	2012-01-17
Charged particle-optical systems, methods and components Grant 8,039,813 - Casares , et al. October 18, 2	2011-10-18
Reducing Particle Implantation App 20110049364 - Knippelmeyer; Rainer ; et al.	2011-03-03
Particle-optical systems and arrangements and particle-optical components for such systems and arrangements App 20100181479 - Knippelmeyer; Rainer ; et al.	2010-07-22
Repairing Defects App 20100052697 - Knippelmeyer; Rainer ; et al.	2010-03-04
Charged Particle Inspection Method and Charged Particle System App 20090256075 - Kemen; Thomas ; et al.	2009-10-15
Charged Particle Beam Exposure System App 20090212240 - Platzgummer; Elmar ; et al.	2009-08-27
Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Grant 7,554,094 - Knippelmeyer , et al. June 30, 2	2009-06-30
Particle-Optical Component App 20090159810 - Knippelmeyer; Rainer ; et al.	2009-06-25
Particle-Optical Component App 20090114818 - Casares; Antonio ; et al.	2009-05-07
Particle-optical systems and arrangements and particle-optical components for such systems and arrangements App 20080054184 - Knippelmeyer; Rainer ; et al.	2008-03-06
Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Grant 7,244,949 - Knippelmeyer , et al. July 17, 2	2007-07-17
Particle-optical systems and arrangements and particle-optical components for such systems and arrangements App 20060289804 - Knippelmeyer; Rainer ; et al.	2006-12-28
Beam guiding arrangement, imaging method, electron microscopy system and electron lithography system Grant 7,135,677 - Kienzle , et al. November 14, 2	2006-11-14
Electron microscopy system and electron microscopy method Grant 7,105,814 - Knippelmeyer September 12, 2	2006-09-12
Detector arrangement and detection method Grant 7,084,406 - Knippelmeyer August 1, 2	2006-08-01
Method for the electron-microscopic observation of a semiconductor arrangement and apparatus therefor Grant 6,967,328 - Kienzle , et al. November 22, 2	2005-11-22
Electron microscopy system Grant 6,946,657 - Kienzle , et al. September 20, 2	2005-09-20
Particle-optical apparatus, electron microscopy system and electron lithography system Grant 6,914,249 - Kienzle , et al. July 5, 2	2005-07-05
Examining system for the particle-optical imaging of an object, deflector for charged particles as well as method for the operation of the same Grant 6,903,337 - Kienzle , et al. June 7, 2	2005-06-07
Particle-optical apparatus and method for operating the same Grant 6,891,168 - Knippelmeyer May 10, 2	2005-05-10
Applications operating with beams of charged particles Grant 6,878,936 - Kienzle , et al. April 12, 2	2005-04-12
Particle-optical apparatus and method for operating the same App 20040113092 - Knippelmeyer, Rainer	2004-06-17
Electron microscopy system App 20040108457 - Kienzle, Oliver ; et al.	2004-06-10
Particle-optical apparatus, electron microscopy system and electron lithography system App 20040105160 - Kienzle, Oliver ; et al.	2004-06-03
Beam guiding arrangement, imaging method, electron microscopy system and electron lithography system App 20040084621 - Kienzle, Oliver ; et al.	2004-05-06
Electron microscopy system and electron microscopy method App 20040075054 - Knippelmeyer, Rainer	2004-04-22
Method for the electron-microscopic observation of a semiconductor arrangement and apparatus therefor App 20040065827 - Kienzle, Oliver ; et al.	2004-04-08
Applications operating with beams of charged particles App 20040056193 - Kienzle, Oliver ; et al.	2004-03-25
Detector arrangement and detection method App 20030116717 - Knippelmeyer, Rainer	2003-06-26
Examining system for the particle-optical imaging of an object, deflector for charged particles as well as method for the operation of the same App 20030066961 - Kienzle, Oliver ; et al.	2003-04-10

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