Klooster; Alex

Patent Applications and Registrations

Patent applications and USPTO patent grants for Klooster; Alex.The latest application filed is for "system and method for reducing convection current effects in the optical path of a holographic interferometry system".

Company Profile

0.6.10

Klooster; Alex - Ann Arbor MI

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Off-axis paraboloid interferometric mirror with off focus illumination Grant 7,440,114 - Klooster , et al. October 21, 2	2008-10-21
System And Method For Reducing Convection Current Effects In The Optical Path Of A Holographic Interferometry System App 20080236306 - Mater; Michael J. ; et al.	2008-10-02
Stabilizer for vibration isolation platform App 20080150204 - klooster; Alex ; et al.	2008-06-26
Method of combining holograms Grant 7,359,065 - Nisper , et al. April 15, 2	2008-04-15
Off-axis paraboloid interferometric mirror with off focus illumination App 20070133010 - Klooster; Alex ; et al.	2007-06-14
Optical fiber delivered reference beam for interferometric imaging App 20070133008 - Klooster; Alex ; et al.	2007-06-14
Method of combining holograms App 20070024866 - Nisper; Jon ; et al.	2007-02-01
Tunable laser App 20060227820 - Klooster; Alex	2006-10-12
Tunable laser App 20060227821 - Klooster; Alex	2006-10-12
Interferometric focusing technique for forming taps in fibers Grant 6,898,350 - Iler , et al. May 24, 2	2005-05-24
Ultra-miniature optical pressure sensing system Grant 6,868,736 - Sawatari , et al. March 22, 2	2005-03-22
Interferometric focusing technique for forming taps in fibers App 20040081400 - Iler, Amber ; et al.	2004-04-29
Ultra-miniature optical pressure sensing system App 20030159518 - Sawatari, Takeo ; et al.	2003-08-28
Holographic scatterometer for detection and analysis of wafer surface deposits Grant 6,597,446 - Klooster , et al. July 22, 2	2003-07-22
Holographic scatterometer for detection and analysis of wafer surface deposits App 20020159052 - Klooster, Alex ; et al.	2002-10-31
Heterodyne scatterometer for detecting and analyzing wafer surface defects Grant 5,923,423 - Sawatari , et al. July 13, 1	1999-07-13

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