Klochkov; Dmitry
Patent Applications and Registrations
Patent applications and USPTO patent grants for Klochkov; Dmitry.The latest application filed is for "contact area size determination between 3d structures in an integrated semiconductor sample".
- Klochkov; Dmitry - Schwaebisch Gmuend DE
| Patent | Date |
|---|---|
| Contact Area Size Determination Between 3d Structures In An Integrated Semiconductor Sample App 20220230899 - Buxbaum; Alex ; et al. | 2022-07-21 |
| FIB-SEM 3D Tomography for measuring shape deviations of HAR structures App 20220223445 - Avishai; Amir ; et al. | 2022-07-14 |
| Cross Section Imaging With Improved 3d Volume Image Reconstruction Accuracy App 20220138973 - Korb; Thomas ; et al. | 2022-05-05 |
| Method For Characterising At Least One Optical Component Of A Projection Exposure Apparatus App 20200218160 - KRUITHOF; Wilbert ; et al. | 2020-07-09 |
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