KLA-Tencor, Inc.

Patent Applications and Registrations

Patent applications and USPTO patent grants for KLA-Tencor, Inc..The latest application filed is for "pattern recognition matching for bright field imaging of low contrast semiconductor devices".

Company Profile

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KLA-Tencor, Inc. - Milpitas CA
KLA Tencor, Inc. - San Jose CA
KLA-Tencor, Inc. -

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for measuring peak carrier concentration in ultra-shallow junctions Grant 7,403,022 - Salnik , et al. July 22, 2	2008-07-22
Dimensional calibration standards Grant 7,301,638 - Tortonese , et al. November 27, 2	2007-11-27
Pattern recognition matching for bright field imaging of low contrast semiconductor devices App 20070139645 - Shen; Wei-Ning ; et al.	2007-06-21
Quick swap load port App 20060045662 - Aalund; Martin P. ; et al.	2006-03-02
Methods and systems for determining a critical dimension and overlay of a specimen App 20040235205 - Levy, Ady ; et al.	2004-11-25
Methods and systems for determining a characteristic of a specimen prior to, during, or subsequent to ion implantation Grant 6,812,045 - Nikoonahad , et al. November 2, 2	2004-11-02
Illumination delivery system Grant 6,796,697 - Bragg , et al. September 28, 2	2004-09-28
Methods and systems for determining a presence of macro defects and overlay of a specimen App 20040115843 - Wack, Dan ; et al.	2004-06-17
Methods and systems for determining a critical dimension and a thin film characteristic of a specimen App 20040073398 - Nikoonahad, Mehrdad ; et al.	2004-04-15
Methods and systems for lithography process control App 20040005507 - Lakkapragada, Suresh ; et al.	2004-01-08
Broad spectrum ultraviolet inspection methods employing catadioptric imaging Grant 6,313,467 - Shafer , et al. November 6, 2	2001-11-06

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