Kiyokawa; Toshiyuki
Patent Applications and Registrations
Patent applications and USPTO patent grants for Kiyokawa; Toshiyuki.The latest application filed is for "passive carrier-based device delivery for slot-based high-volume semiconductor test system".
- Kiyokawa; Toshiyuki - Kukishi Saitama JP
- Kiyokawa; Toshiyuki - Tokyo JP
- Kiyokawa; Toshiyuki - Saitama N/A JP
- Kiyokawa; Toshiyuki - Kuki JP
- Kiyokawa; Toshiyuki - Kitakatsushika JP
| Patent | Date |
|---|---|
| Passive Carrier-based Device Delivery For Slot-based High-volume Semiconductor Test System App 20220137129 - Ranganathan; Karthik ; et al. | 2022-05-05 |
| Test Carrier And Carrier Assembling Apparatus App 20220011342 - Kiyokawa; Toshiyuki ; et al. | 2022-01-13 |
| Test Carrier And Carrier Assembling Apparatus App 20220011343 - Kiyokawa; Toshiyuki ; et al. | 2022-01-13 |
| Test Carrier And Carrier Assembling Apparatus App 20220011341 - Kiyokawa; Toshiyuki ; et al. | 2022-01-13 |
| Test Carrier And Carrier Assembling Apparatus App 20220011340 - Kiyokawa; Toshiyuki ; et al. | 2022-01-13 |
| Test Carrier And Carrier Assembling Apparatus App 20190346482 - Kiyokawa; Toshiyuki ; et al. | 2019-11-14 |
| Electronic device handling apparatus and electronic device testing apparatus Grant 9,588,142 - Kiyokawa , et al. March 7, 2 | 2017-03-07 |
| Electronic Device Handling Apparatus And Electronic Device Testing Apparatus App 20160116503 - KIYOKAWA; Toshiyuki ; et al. | 2016-04-28 |
| Semiconductor wafer test apparatus Grant 9,121,901 - Kiyokawa , et al. September 1, 2 | 2015-09-01 |
| Wafer tray and test apparatus Grant 8,513,962 - Kiyokawa , et al. August 20, 2 | 2013-08-20 |
| Test apparatus, test method and computer readable medium Grant 8,493,083 - Kiyokawa July 23, 2 | 2013-07-23 |
| Test apparatus and test method Grant 8,299,935 - Kiyokawa , et al. October 30, 2 | 2012-10-30 |
| Semiconductor Wafer Test Apparatus App 20110316571 - Kiyokawa; Toshiyuki ; et al. | 2011-12-29 |
| Test Apparatus And Test Method App 20110298630 - KIYOKAWA; Toshiyuki ; et al. | 2011-12-08 |
| Test Apparatus, Test Method And Computer Readable Medium App 20110128024 - KIYOKAWA; Toshiyuki | 2011-06-02 |
| Wafer Tray And Test Apparatus App 20110043237 - KIYOKAWA; Toshiyuki ; et al. | 2011-02-24 |
| Electronic part test apparatus Grant 7,298,156 - Okuda , et al. November 20, 2 | 2007-11-20 |
| Image sensor test apparatus App 20070159532 - Kiyokawa; Toshiyuki | 2007-07-12 |
| Electronic part test apparatus App 20050151551 - Okuda, Hiroshi ; et al. | 2005-07-14 |
| IC chip tester with heating element for preventing condensation App 20030122566 - Takahashi, Hiroyuki ; et al. | 2003-07-03 |
| Contact arm and electronic device testing apparatus using the same App 20020186005 - Yamashita, Tsuyoshi ; et al. | 2002-12-12 |
| IC chip tester with heating element for preventing condensation App 20020011863 - Takahashi, Hiroyuki ; et al. | 2002-01-31 |
| Contact arm and electronic device testing apparatus using the same App 20010054893 - Yamashita, Tsuyoshi ; et al. | 2001-12-27 |
| IC chip tester with heating element for preventing condensation Grant 6,313,653 - Takahashi , et al. November 6, 2 | 2001-11-06 |
| IC module insert Grant D442,568 - Masuo , et al. May 22, 2 | 2001-05-22 |
| Integrated circuit transporting apparatus including a guide with an integrated circuit positioning function Grant 5,920,192 - Kiyokawa July 6, 1 | 1999-07-06 |
| IC test equipment Grant 5,177,435 - Kiyokawa , et al. January 5, 1 | 1993-01-05 |
| IC test equipment Grant 5,172,049 - Kiyokawa , et al. December 15, 1 | 1992-12-15 |
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