loadpatents
name:-0.018993854522705
name:-0.015129804611206
name:-0.0030219554901123
Kiyofuji; Hidehiro Patent Filings

Kiyofuji; Hidehiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kiyofuji; Hidehiro.The latest application filed is for "probe card".

Company Profile
2.13.13
  • Kiyofuji; Hidehiro - Tokyo JP
  • Kiyofuji; Hidehiro - Saitama JP
  • Kiyofuji; Hidehiro - Oita JP
  • Kiyofuji; Hidehiro - Hirosaki JP
  • KIYOFUJI; Hidehiro - Oita-shi JP
  • Kiyofuji; Hidehiro - Aomori JP
  • Kiyofuji; Hidehiro - Hirosaki-shi JP
  • Kiyofuji; Hidehiro - Aomori-ken JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Probe card
Grant 10,705,122 - Fukami , et al.
2020-07-07
Probe Card
App 20190154730 - FUKAMI; Yoshiyuki ;   et al.
2019-05-23
Probe card with temperature control function, inspection apparatus using the same, and inspection method
Grant 10,295,590 - Saito , et al.
2019-05-21
Probe Card With Temperature Control Function, Inspection Device Using The Same, And Inspection Method
App 20170363680 - SAITO; Yuki ;   et al.
2017-12-21
Electric connecting apparatus
Grant 9,535,090 - Inoue , et al. January 3, 2
2017-01-03
Electric connecting apparatus
Grant 9,400,309 - Kiyofuji , et al. July 26, 2
2016-07-26
Probe card and method for manufacturing the same
Grant 9,341,651 - Arai , et al. May 17, 2
2016-05-17
Electric Connecting Apparatus
App 20150008946 - INOUE; Tatsuo ;   et al.
2015-01-08
Electric Connecting Apparatus
App 20150008945 - KIYOFUJI; Hidehiro ;   et al.
2015-01-08
Probe Card And Method For Manufacturing The Same
App 20140368229 - ARAI; Osamu ;   et al.
2014-12-18
Method and apparatus for testing integrated circuit
Grant 8,680,880 - Kiyofuji , et al. March 25, 2
2014-03-25
Electrical connecting apparatus
Grant 7,843,204 - Kiyofuji , et al. November 30, 2
2010-11-30
Method And Apparatus For Testing Integrated Circuit
App 20100164520 - KIYOFUJI; Hidehiro ;   et al.
2010-07-01
Probe assembly, method of producing it and electrical connecting apparatus
Grant 7,667,472 - Miura , et al. February 23, 2
2010-02-23
Probe board mounting apparatus
Grant 7,586,316 - Kuniyoshi , et al. September 8, 2
2009-09-08
Electrical Connecting Apparatus
App 20090212800 - KIYOFUJI; Hidehiro ;   et al.
2009-08-27
Electrical connecting apparatus
Grant 7,525,329 - Miyagi , et al. April 28, 2
2009-04-28
Probe Assembly, Method Of Producing It And Electrical Connecting Apparatus
App 20090058440 - Miura; Kiyotoshi ;   et al.
2009-03-05
Electrical Connecting Apparatus
App 20080315905 - Kuniyoshi; Shinji ;   et al.
2008-12-25
Electrical connecting apparatus
Grant 7,468,610 - Miyagi , et al. December 23, 2
2008-12-23
Electric connector and electrical connecting apparatus using the same
Grant 7,458,818 - Kiyofuji , et al. December 2, 2
2008-12-02
Electric Connector And Electrical Connecting Apparatus Using The Same
App 20080139017 - KIYOFUJI; Hidehiro ;   et al.
2008-06-12
Electrical Connecting Apparatus
App 20080122466 - MIYAGI; Yuji ;   et al.
2008-05-29
Electrical Connecting Apparatus
App 20080122467 - MIYAGI; Yuji ;   et al.
2008-05-29
Probe assembly
App 20070069748 - Kiyofuji; Hidehiro ;   et al.
2007-03-29

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