KITSUKI; Hirohiko

Patent Applications and Registrations

Patent applications and USPTO patent grants for KITSUKI; Hirohiko.The latest application filed is for "charged particle beam apparatus".

Company Profile

2.8.10

KITSUKI; Hirohiko - Tokyo JP
Kitsuki; Hirohiko - Hitachinaka JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged Particle Beam Apparatus App 20220028652 - MATSUMOTO; Kosuke ; et al.	2022-01-27
Pattern cross-sectional shape estimation system and program Grant 11,211,226 - Yokosuka , et al. December 28, 2	2021-12-28
Charged particle beam system, method for determining range for automatically searching for focal point position in charged particle beam device, and non-transitory storage medium recording program for causing computer system to determine range for automatically searching for focal position in charge Grant 11,195,694 - Matsumoto , et al. December 7, 2	2021-12-07
Scanning electron microscope and calculation method for three-dimensional structure depth Grant 11,164,720 - Yasui , et al. November 2, 2	2021-11-02
Charged Particle Beam System, Method for Determining Range for Automatically Searching for Focal Point Position in Charged Particle Beam Device, and Non-Transitory Storage Medium Recording Program for Causing Computer System to Determine Range for Automatically Searching for Focal Position in Charge App 20210166911 - MATSUMOTO; Kosuke ; et al.	2021-06-03
Pattern Cross-sectional Shape Estimation System And Program App 20200321189 - YOKOSUKA; Toshiyuki ; et al.	2020-10-08
Scanning Electron Microscope And Calculation Method For Three-dimensional Structure Depth App 20200234916 - YASUI; Kenji ; et al.	2020-07-23
Defect observation method and defect observation device Grant 9,811,897 - Harada , et al. November 7, 2	2017-11-07
Defect Observation Method And Defect Observation Device App 20150332445 - HARADA; Minoru ; et al.	2015-11-19
Charged-particle microscope Grant 8,859,962 - Takahashi , et al. October 14, 2	2014-10-14
Charged-particle Microscope App 20140197313 - TAKAHASHI; Noritsugu ; et al.	2014-07-17
Charged-particle Microscope App 20120119087 - Takahashi; Noritsugu ; et al.	2012-05-17
Scanning electron microscope Grant 8,153,970 - Kitsuki , et al. April 10, 2	2012-04-10
Scanning Electron Microscope App 20100320385 - KITSUKI; Hirohiko ; et al.	2010-12-23
Scanning electron microscope Grant 7,807,966 - Kitsuki , et al. October 5, 2	2010-10-05
Scanning Electron Microscope App 20090050805 - Kitsuki; Hirohiko ; et al.	2009-02-26
Scanning electron microscope Grant 7,442,929 - Kitsuki , et al. October 28, 2	2008-10-28
Scanning electron microscope App 20060226362 - Kitsuki; Hirohiko ; et al.	2006-10-12

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