Kitajima; Itaru
Patent Applications and Registrations
Patent applications and USPTO patent grants for Kitajima; Itaru.The latest application filed is for "probe aligning method for probe microscope and probe microscope operated by the same".
- Kitajima; Itaru - Chiba N/A JP
- Kitajima; Itaru - Chiba-shi JP
| Patent | Date |
|---|---|
| Probe aligning method for probe microscope and probe microscope operated by the same Grant 8,495,759 - Wakiyama , et al. July 23, 2 | 2013-07-23 |
| Probe Aligning Method For Probe Microscope And Probe Microscope Operated By The Same App 20100031402 - Wakiyama; Shigeru ; et al. | 2010-02-04 |
| Method for fabricating nanometer-scale structure Grant 7,476,418 - Yasutake , et al. January 13, 2 | 2009-01-13 |
| Cantilever holder and scanning probe microscope Grant 7,375,322 - Kitajima , et al. May 20, 2 | 2008-05-20 |
| Scanning probe microscope and scanning method Grant 7,373,806 - Kitajima , et al. May 20, 2 | 2008-05-20 |
| Cantilever holder and scanning probe microscope App 20060219916 - Kitajima; Itaru ; et al. | 2006-10-05 |
| Scanning probe microscope Grant 7,026,607 - Kitajima , et al. April 11, 2 | 2006-04-11 |
| Method for fabricating nanometer-scale structure App 20050089463 - Yasutake, Masatoshi ; et al. | 2005-04-28 |
| Scanning probe microscope and scanning method App 20050050947 - Kitajima, Itaru ; et al. | 2005-03-10 |
| Scanning probe microscope App 20040227076 - Kitajima, Itaru ; et al. | 2004-11-18 |
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