Kitai; Naoki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kitai; Naoki.The latest application filed is for "semiconductor integrated circuit device with reduced leakage current".

Company Profile

0.21.19

Kitai; Naoki - Fussa JP
Kitai; Naoki - Tsuchiura JP
Kitai; Naoki - Tachikawa JP
Kitai; Naoki - Akishima JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor integrated circuit device with reduced leakage current Grant 9,530,485 - Osada , et al. December 27, 2	2016-12-27
Semiconductor Integrated Circuit Device With Reduced Leakage Current App 20150357026 - OSADA; Kenichi ; et al.	2015-12-10
Semiconductor integrated circuit device with reduced leakage current Grant 9,111,636 - Osada , et al. August 18, 2	2015-08-18
Semiconductor Integrated Circuit Device with Reduced Leakage Current App 20150155031 - OSADA; Kenichi ; et al.	2015-06-04
Semiconductor device including a pair of shield lines Grant 8,847,431 - Shido , et al. September 30, 2	2014-09-30
Semiconductor integrated circuit device with reduced leakage current Grant 8,797,791 - Osada , et al. August 5, 2	2014-08-05
Semiconductor Integrated Circuit Device With Reduced Leakage Current App 20130229860 - Osada; Kenichi ; et al.	2013-09-05
Semiconductor integrated circuit device with reduced leakage current Grant 8,437,179 - Osada , et al. May 7, 2	2013-05-07
Semiconductor Integrated Circuit Device With Reduced Leakage Current App 20120257443 - Osada; Kenichi ; et al.	2012-10-11
Semiconductor integrated circuit device with reduced leakage current Grant 8,232,589 - Osada , et al. July 31, 2	2012-07-31
Semiconductor Device Including A Pair Of Shield Lines App 20120112563 - SHIDO; Taihei ; et al.	2012-05-10
Semiconductor Integrated Circuit Device with Reduced Leakage Current App 20120113709 - Osada; Kenichi ; et al.	2012-05-10
Semiconductor integrated circuit device with reduced leakage current Grant 8,125,017 - Osada , et al. February 28, 2	2012-02-28
Semiconductor device Grant 8,031,511 - Osada , et al. October 4, 2	2011-10-04
Semiconductor integrated circuit device with reduced leakage current App 20110215414 - Osada; Kenichi ; et al.	2011-09-08
Semiconductor integrated circuit device with reduced leakage current Grant 7,964,484 - Osada , et al. June 21, 2	2011-06-21
Semiconductor Device App 20110128780 - OSADA; Kenichi ; et al.	2011-06-02
Semiconductor integrated circuit Grant 7,907,442 - Kitai , et al. March 15, 2	2011-03-15
Semiconductor device Grant 7,907,435 - Osada , et al. March 15, 2	2011-03-15
Semiconductor memory device layout comprising high impurity well tap areas for supplying well voltages to N wells and P wells Grant 7,692,943 - Osada , et al. April 6, 2	2010-04-06
Semiconductor Integrated Circuit App 20100073999 - Kitai; Naoki ; et al.	2010-03-25
Semiconductor integrated circuit device with reduced leakage current App 20090269899 - OSADA; Kenichi ; et al.	2009-10-29
Semiconductor integrated circuit device with reduced leakage current Grant 7,569,881 - Osada , et al. August 4, 2	2009-08-04
Semiconductor Device App 20090073753 - Osada; Kenichi ; et al.	2009-03-19
Semiconductor integrated circuit device with reduced leakage current App 20080203437 - Osada; Kenichi ; et al.	2008-08-28
Semiconductor integrated circuit device with reduced leakage current Grant 7,388,238 - Osada , et al. June 17, 2	2008-06-17
Semiconductor memory device layout comprising high impurity well tap areas for supplying well voltages to NWELLS and PWELLS App 20080094869 - OSADA; Kenichi ; et al.	2008-04-24
Semiconductor memory device layout comprising high impurity well tap areas for supplying well voltages to N wells and P wells Grant 7,319,603 - Osada , et al. January 15, 2	2008-01-15
Semiconductor integrated circuit device with reduced leakage current App 20060226449 - Osada; Kenichi ; et al.	2006-10-12
Semiconductor integrated circuit device with reduced leakage current Grant 7,087,942 - Osada , et al. August 8, 2	2006-08-08
Semiconductor integrated circuit device with reduced leakage current App 20060076610 - Osada; Kenichi ; et al.	2006-04-13
Semiconductor integrated circuit device with reduced leakage current Grant 6,998,674 - Osada , et al. February 14, 2	2006-02-14
Semiconductor device App 20060028853 - Osada; Kenichi ; et al.	2006-02-09
Semiconductor device Grant 6,977,858 - Osada , et al. December 20, 2	2005-12-20
Semiconductor integrated circuit device with reduced leakage current App 20050174141 - Osada, Kenichi ; et al.	2005-08-11
Semiconductor integrated circuit device with reduced leakage current Grant 6,885,057 - Osada , et al. April 26, 2	2005-04-26
Semiconductor device App 20040125676 - Osada, Kenichi ; et al.	2004-07-01
Semiconductor integrated circuit device with reduced leakage current App 20020179940 - Osada, Kenichi ; et al.	2002-12-05

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