Kitahashi; Katsuhiro
Patent Applications and Registrations
Patent applications and USPTO patent grants for Kitahashi; Katsuhiro.The latest application filed is for "defect observation method and defect observation device".
- Kitahashi; Katsuhiro - Hitachinaka JP
| Patent | Date |
|---|---|
| Defect observation method and defect observation device Grant 8,824,773 - Minekawa , et al. September 2, 2 | 2014-09-02 |
| Defect Observation Method And Defect Observation Device App 20130140457 - Minekawa; Yohei ; et al. | 2013-06-06 |
| Sem Type Defect Observation Device And Defect Image Acquiring Method App 20120327212 - Kitahashi; Katsuhiro ; et al. | 2012-12-27 |
| Defect inspection method Grant 7,181,060 - Honda , et al. February 20, 2 | 2007-02-20 |
| Investigation device and investigation method Grant 6,968,079 - Yoshikawa , et al. November 22, 2 | 2005-11-22 |
| Defect inspection method App 20030015659 - Honda, Toshifumi ; et al. | 2003-01-23 |
| Investigation device and investigation method App 20020001404 - Yoshikawa, Akira ; et al. | 2002-01-03 |
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