Kitagawa; Katsuichi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kitagawa; Katsuichi.The latest application filed is for "film thickness measurement device and film thickness measurement method".

Company Profile

1.6.3

Kitagawa; Katsuichi - Moriyama JP
KITAGAWA; Katsuichi - Moriyama-shi Shiga
Kitagawa; Katsuichi - Shiga-ken JP
Kitagawa; Katsuichi - Otsu JP
Kitagawa; Katsuichi - Shiga JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Film thickness measurement device using interference of light and film thickness measurement method using interference of light Grant 10,274,307 - Kitagawa , et al.	2019-04-30
Film Thickness Measurement Device And Film Thickness Measurement Method App 20180045506 - KITAGAWA; Katsuichi ; et al.	2018-02-15
Method of measuring defect density of single crystal Grant 8,831,910 - Shintani , et al. September 9, 2	2014-09-09
Method Of Measuring Defect Density Of Single Crystal App 20120016630 - Shintani; Yoshitomo ; et al.	2012-01-19
Method for measuring surface profile, and apparatus using the same Grant 7,852,489 - Sugiyama , et al. December 14, 2	2010-12-14
Method For Measuring Surface Profile, And Apparatus Using The Same App 20090009773 - Sugiyama; Masashi ; et al.	2009-01-08
Method and apparatus for determining position of points on article Grant 4,693,608 - Kitagawa , et al. September 15, 1	1987-09-15
Method for controlling the gap between lips of a die for extruding a plastic sheet material Grant 3,985,845 - Akatsuka , et al. October 12, 1	1976-10-12

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