Kister; January

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kister; January.The latest application filed is for "probe on carrier architecture for vertical probe arrays".

Company Profile

4.73.49

Kister; January - Portola Valley CA
Kister; January - Redwood City CA
Kister; January - Menlo Park CA
Kister; January - Palo Alto CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Probe on carrier architecture for vertical probe arrays Grant 11,293,947 - Selvaraj , et al. April 5, 2	2022-04-05
MEMS probe card assembly having decoupled electrical and mechanical probe connections Grant 11,156,640 - Selvaraj , et al. October 26, 2	2021-10-26
Electrical test probes having decoupled electrical and mechanical design Grant 11,156,637 - Kister , et al. October 26, 2	2021-10-26
Probe tip with embedded skate Grant 11,054,443 - Kister , et al. July 6, 2	2021-07-06
Probe on carrier architecture for vertical probe arrays App 20200341030 - Selvaraj; Mukesh ; et al.	2020-10-29
Electrical test probes having decoupled electrical and mechanical design App 20190383857 - Kister; January ; et al.	2019-12-19
Probe tip with embedded skate App 20190293685 - Kister; January ; et al.	2019-09-26
MEMS Probe Card Assembly having Decoupled Electrical and Mechanical Probe connections App 20190128924 - Selvaraj; Mukesh ; et al.	2019-05-02
Probe skates for electrical testing of convex pad topologies Grant RE46,221 - Kister November 29, 2	2016-11-29
Probes with high current carrying capability and laser machining methods Grant 9,476,911 - Kister October 25, 2	2016-10-25
Multiple contact probes Grant 9,316,670 - Kister April 19, 2	2016-04-19
Probe retention arrangement Grant 9,310,428 - Kister , et al. April 12, 2	2016-04-12
Vertical probe array arranged to provide space transformation Grant 9,274,143 - Kister March 1, 2	2016-03-01
Probe bonding method having improved control of bonding material Grant 9,250,266 - Kister February 2, 2	2016-02-02
Probes with offset arm and suspension structure Grant 9,121,868 - Kister September 1, 2	2015-09-01
Layered probes with core Grant 9,097,740 - Kister August 4, 2	2015-08-04
Multiple Contact Probes App 20150192615 - Kister; January	2015-07-09
Probe Retention Arrangement App 20150091596 - Kister; January ; et al.	2015-04-02
Multiple contact probes Grant 8,988,091 - Kister March 24, 2	2015-03-24
Probe retention arrangement Grant 8,907,689 - Kister , et al. December 9, 2	2014-12-09
Fine pitch guided vertical probe array having enclosed probe flexures Grant 8,829,937 - Kister September 9, 2	2014-09-09
Vertical guided layered probe Grant 8,723,546 - Kister May 13, 2	2014-05-13
Vertical Probes For Multi-pitch Full Grid Contact Array App 20140043054 - Kister; January	2014-02-13
Probe Fabrication Using Combined Laser And Micro-fabrication Technologies App 20140044985 - Kister; January	2014-02-13
Space transformers employing wire bonds for interconnections with fine pitch contacts Grant RE44,407 - Kister August 6, 2	2013-08-06
Vertical Probe Array Arranged To Provide Space Transformation App 20130093450 - Kister; January	2013-04-18
Low profile probe having improved mechanical scrub and reduced contact inductance Grant 8,415,963 - Kister April 9, 2	2013-04-09
Probes With Offset Arm And Suspension Structure App 20120313660 - Kister; January	2012-12-13
Probe Bonding Method Having Improved Control Of Bonding Material App 20120313621 - Kister; January	2012-12-13
Vertical probe array arranged to provide space transformation Grant 8,324,923 - Kister December 4, 2	2012-12-04
Probes With High Current Carrying Capability And Laser Machining Methods App 20120286816 - Kister; January	2012-11-15
Fine pitch guided vertical probe array having enclosed probe flexures App 20120194212 - Kister; January	2012-08-02
Probe bonding method having improved control of bonding material Grant 8,230,593 - Kister July 31, 2	2012-07-31
Probe skates for electrical testing of convex pad topologies Grant RE43,503 - Kister July 10, 2	2012-07-10
Probes with offset arm and suspension structure Grant 8,203,353 - Kister June 19, 2	2012-06-19
Knee probe having reduced thickness section for control of scrub motion Grant 8,111,080 - Kister February 7, 2	2012-02-07
Vertical Probe Array Arranged To Provide Space Transformation App 20110273199 - Kister; January	2011-11-10
Low Profile Probe Having Improved Mechanical Scrub And Reduced Contact Inductance App 20110273198 - Kister; January	2011-11-10
Vertical probe array arranged to provide space transformation Grant 7,952,377 - Kister May 31, 2	2011-05-31
Low profile probe having improved mechanical scrub and reduced contact inductance Grant 7,944,224 - Kister May 17, 2	2011-05-17
Multiple Contact Probes App 20110062978 - Kister; January	2011-03-17
Probe Retention Arrangement App 20110006796 - Kister; January ; et al.	2011-01-13
Probes With Offset Arm And Suspension Structure App 20100289512 - Kister; January	2010-11-18
Probe cards employing probes having retaining portions for potting in a potting region Grant 7,786,740 - Kister August 31, 2	2010-08-31
Layered Probes With Core App 20100182031 - Kister; January	2010-07-22
Knee Probe Having Reduced Thickness Section for Control of Scrub Motion App 20100182030 - Kister; January	2010-07-22
Probes with self-cleaning blunt skates for contacting conductive pads Grant 7,759,949 - Kister July 20, 2	2010-07-20
Vertical Guided Layered Probe App 20100176832 - Kister; January	2010-07-15
Knee probe having increased scrub motion Grant 7,733,101 - Kister June 8, 2	2010-06-08
Low Profile Probe Having Improved Mechanical Scrub and Reduced Contact Inductance App 20100109691 - Kister; January	2010-05-06
Vertical guided probe array providing sideways scrub motion Grant 7,671,610 - Kister March 2, 2	2010-03-02
Knee probe having reduced thickness section for control of scrub motion Grant 7,659,739 - Kister February 9, 2	2010-02-09
Low profile probe having improved mechanical scrub and reduced contact inductance Grant 7,649,367 - Kister January 19, 2	2010-01-19
Probe bonding method having improved control of bonding material App 20090293274 - Kister; January	2009-12-03
Vertical Probe Array Arranged to Provide Space Transformation App 20090201041 - Kister; January	2009-08-13
Vertical guided probe array providing sideways scrub motion App 20090102495 - Kister; January	2009-04-23
Vertical probe array arranged to provide space transformation Grant 7,514,948 - Kister April 7, 2	2009-04-07
Low profile probe having improved mechanical scrub and reduced contact inductance App 20080265873 - Kister; January	2008-10-30
Vertical probe array arranged to provide space transformation App 20080252325 - Kister; January	2008-10-16
Probe skates for electrical testing of convex pad topologies Grant 7,436,192 - Kister October 14, 2	2008-10-14
Probe cards employing probes having retaining portions for potting in a retention arrangement Grant 7,417,447 - Kister August 26, 2	2008-08-26
Probe cards employing probes having retaining portions for potting in a retention arrangement App 20080111572 - Kister; January	2008-05-15
Probe cards employing probes having retaining portions for potting in a potting region App 20080088327 - Kister; January	2008-04-17
Knee probe having reduced thickness section for control of scrub motion App 20080068035 - Kister; January	2008-03-20
Probe cards employing probes having retaining portions for potting in a retention arrangement Grant 7,345,492 - Kister March 18, 2	2008-03-18
Probes with self-cleaning blunt skates for contacting conductive pads App 20080001612 - Kister; January	2008-01-03
Probe skates for electrical testing of convex pad topologies App 20080001613 - Kister; January	2008-01-03
Space transformers employing wire bonds for interconnections with fine pitch contacts Grant 7,312,617 - Kister December 25, 2	2007-12-25
Space transformers employing wire bonds for interconnections with fine pitch contacts App 20070216432 - Kister; January	2007-09-20
Knee probe having increased scrub motion App 20070152686 - Kister; January	2007-07-05
Probe cards employing probes having retaining portions for potting in a retention arrangement App 20070132466 - Kister; January	2007-06-14
Multipath interconnect with meandering contact cantilevers Grant 7,217,138 - Kister , et al. May 15, 2	2007-05-15
See-saw interconnect assembly with dielectric carrier grid providing spring suspension Grant 7,189,078 - Kister , et al. March 13, 2	2007-03-13
Prefabricated and attached interconnect structure Grant 7,173,441 - Kister , et al. February 6, 2	2007-02-06
Freely deflecting knee probe with controlled scrub motion Grant 7,148,709 - Kister December 12, 2	2006-12-12
Cantilever probe with dual plane fixture and probe apparatus therewith Grant 7,091,729 - Kister August 15, 2	2006-08-15
Sheet metal interconnect array Grant D525,207 - Kister , et al. July 18, 2	2006-07-18
Bundled probe apparatus for multiple terminal contacting Grant 7,064,564 - Kister , et al. June 20, 2	2006-06-20
See-saw interconnect assembly with dielectric carrier grid providing spring suspension Grant 7,059,865 - Kister , et al. June 13, 2	2006-06-13
Double acting spring probe Grant 7,046,021 - Kister May 16, 2	2006-05-16
Multipath interconnect with meandering contact cantilevers App 20060068612 - Kister; January ; et al.	2006-03-30
Cantilever probe with dual plane fixture and probe apparatus therewith App 20060006887 - Kister; January	2006-01-12
Double Acting Spring Probe App 20060001437 - Kister; January	2006-01-05
Freely deflecting knee probe with controlled scrub motion App 20050258844 - Kister, January	2005-11-24
Prefabricated and attached interconnect structure Grant 6,965,245 - Kister , et al. November 15, 2	2005-11-15
Sheet metal coil spring testing connector App 20050245142 - Kister, January	2005-11-03
Continuously profiled probe beam Grant D510,043 - Kister September 27, 2	2005-09-27
Multipath interconnect with meandering contact cantilevers App 20050196980 - Kister, January ; et al.	2005-09-08
Test pin back surface in probe apparatus for low wear multiple contacting with conductive elastomer App 20050174136 - Zhou, Jiachun ; et al.	2005-08-11
See-saw Interconnect Assembly With Dielectric Carrier Grid Providing Spring Suspension App 20050159025 - Kister, January ; et al.	2005-07-21
See-saw interconnect assembly with dielectric carrier grid providing spring suspension App 20050159027 - Kister, January ; et al.	2005-07-21
Straight protruding probe beam contour surfaces Grant D507,198 - Kister July 12, 2	2005-07-12
Multipath interconnect with meandering contact cantilevers Grant 6,890,185 - Kister , et al. May 10, 2	2005-05-10
Multipath Interconnect With Meandering Contact Cantilevers App 20050095879 - Kister, January ; et al.	2005-05-05
Prefabricated and attached interconnect structure App 20050052194 - Kister, January ; et al.	2005-03-10
Prefabricated and attached interconnect structure App 20040217768 - Kister, January ; et al.	2004-11-04
Interface structure for contacting probe beams Grant 6,570,396 - Kister May 27, 2	2003-05-27
Method for making a probe apparatus for testing integrated circuits Grant 6,530,148 - Kister March 11, 2	2003-03-11
Modular probe apparatus Grant 6,525,552 - Kister February 25, 2	2003-02-25
Modular probe apparatus App 20020167328 - Kister, January	2002-11-14
Bundled probe apparatus for multiple terminal contacting App 20020101248 - Kister, January ; et al.	2002-08-01
Probe apparatus having removable beam probes Grant 6,424,164 - Kister July 23, 2	2002-07-23
Probe assembly having floatable buckling beam probes and apparatus for abrading the same Grant 6,419,500 - Kister July 16, 2	2002-07-16
Modulated space transformer for high density buckling beam probe and method for making the same Grant 6,420,887 - Kister , et al. July 16, 2	2002-07-16
High temperature probe card for testing integrated circuits Grant 6,064,215 - Kister May 16, 2	2000-05-16
Dual contact probe assembly for testing integrated circuits Grant 5,764,072 - Kister June 9, 1	1998-06-09
Method and apparatus for aligning probes Grant 5,751,157 - Kister May 12, 1	1998-05-12
Membrane for holding a probe tip in proper location Grant 5,742,174 - Kister , et al. April 21, 1	1998-04-21
Method for making a probe preserving a uniform stress distribution under deflection Grant 5,720,098 - Kister February 24, 1	1998-02-24
Method and circuit testing apparatus for equalizing a contact force between probes and pads Grant 5,644,249 - Kister July 1, 1	1997-07-01
Large scale protrusion membrane for semiconductor devices under test with very high pin counts Grant 5,422,574 - Kister June 6, 1	1995-06-06

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