Patent | Date |
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Exposure apparatus and device manufacturing method using original with phase-modulation diffraction grating to form interference pattern Grant 9,164,370 - Kishikawa , et al. October 20, 2 | 2015-10-20 |
Exposure apparatus Grant 7,733,461 - Kishikawa June 8, 2 | 2010-06-08 |
Exposure Apparatus And Device Manufacturing Method App 20090257039 - Kishikawa; Yasuhiro ;   et al. | 2009-10-15 |
Method and apparatus for measuring birefringence Grant 7,286,226 - Takeuchi , et al. October 23, 2 | 2007-10-23 |
Birefringence measurement apparatus, strain remover, polarimeter and exposure apparatus Grant 7,251,029 - Kishikawa , et al. July 31, 2 | 2007-07-31 |
Polarization state detecting system, light source, and exposure apparatus Grant 7,180,051 - Takeuchi , et al. February 20, 2 | 2007-02-20 |
Beam splitting apparatus, transmittance measurement apparatus, and exposure apparatus Grant 7,161,675 - Kishikawa , et al. January 9, 2 | 2007-01-09 |
Exposure apparatus App 20060290912 - Kishikawa; Yasuhiro | 2006-12-28 |
Beam splitting apparatus, transmittance measurement apparatus, and exposure apparatus Grant 7,095,497 - Kishikawa , et al. August 22, 2 | 2006-08-22 |
Exposure apparatus that acquires information regarding a polarization state of light from a light source Grant 7,015,456 - Takeuchi , et al. March 21, 2 | 2006-03-21 |
Polarization state detecting system, light source, and exposure apparatus App 20060033019 - Takeuchi; Seiji ;   et al. | 2006-02-16 |
Beam splitting apparatus, transmittance measurement apparatus, and exposure apparatus Grant 6,992,763 - Kishikawa , et al. January 31, 2 | 2006-01-31 |
Exposure apparatus and method App 20050185155 - Kishikawa, Yasuhiro | 2005-08-25 |
Beam splitting apparatus, transmittance measurement apparatus, and exposure apparatus App 20040223443 - Kishikawa, Yasuhiro ;   et al. | 2004-11-11 |
Beam splitting apparatus, transmittance measurement apparatus, and exposure apparatus App 20040223228 - Kishikawa, Yasuhiro ;   et al. | 2004-11-11 |
Method and apparatus for measuring birefringence App 20040156051 - Takeuchi, Seiji ;   et al. | 2004-08-12 |
Birefringence measurement apparatus, strain remover, polarimeter and exposure apparatus App 20040008348 - Kishikawa, Yasuhiro ;   et al. | 2004-01-15 |
Polarization state detecting system, light source, and exposure apparatus App 20030234348 - Takeuchi, Seiji ;   et al. | 2003-12-25 |
Beam splitting apparatus, transmittance measurement apparatus, and exposure apparatus App 20030043376 - Kishikawa, Yasuhiro ;   et al. | 2003-03-06 |