KISHI; Taketo
Patent Applications and Registrations
Patent applications and USPTO patent grants for KISHI; Taketo.The latest application filed is for "utensil for evaluating length measurement error in x-ray ct device for three-dimensional shape measurement".
- KISHI; Taketo - Kyoto-shi JP
- Kishi; Taketo - Kyoto JP
- Kishi, Taketo - Osaka-shi JP
| Patent | Date |
|---|---|
| Utensil For Evaluating Length Measurement Error In X-ray Ct Device For Three-dimensional Shape Measurement App 20220175337 - KISHI; Taketo ; et al. | 2022-06-09 |
| X-ray Tube Billing System App 20220107278 - ITO; Fumihiko ; et al. | 2022-04-07 |
| Utensil for evaluating length measurement error in X-ray CT device for three-dimensional shape measurement Grant 11,291,425 - Kishi , et al. April 5, 2 | 2022-04-05 |
| Utensil For Evaluating Length Measurement Error In X-ray Ct Device For Three-dimensional Shape Measurement App 20210282734 - KISHI; Taketo ; et al. | 2021-09-16 |
| Section reconstruction method and radiographic apparatus App 20030021373 - Ukita, Masaaki ; et al. | 2003-01-30 |
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