Kirkwood; Jason

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kirkwood; Jason.The latest application filed is for "defect size measurement using deep learning methods".

Company Profile

3.12.11

Kirkwood; Jason - Mountain View CA
Kirkwood; Jason - Santa Clara CA
Kirkwood; Jason - Belleville MI

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Defect Size Measurement Using Deep Learning Methods App 20210364450 - Lauber; Jan ; et al.	2021-11-25
System and method for characterization of buried defects Grant 10,854,486 - Kirkwood , et al. December 1, 2	2020-12-01
Systems and methods for detecting defects on a wafer Grant 10,605,744 - Chen , et al.	2020-03-31
System and Method for Characterization of Buried Defects App 20200090969 - Kirkwood; Jason ; et al.	2020-03-19
Systems And Methods For Detecting Defects On A Wafer App 20180202943 - Chen; Lu ; et al.	2018-07-19
Systems and methods for detecting defects on a wafer Grant 9,880,107 - Chen , et al. January 30, 2	2018-01-30
Data perturbation for wafer inspection or metrology setup using a model of a difference Grant 9,360,863 - Thattaisundaram , et al. June 7, 2	2016-06-07
Automated inspection scenario generation Grant 9,053,390 - Mahadevan , et al. June 9, 2	2015-06-09
Automated Inspection Scenario Generation App 20140050389 - Mahadevan; Mohan ; et al.	2014-02-20
Systems and Methods for Detecting Defects on a Wafer App 20130250287 - Chen; Lu ; et al.	2013-09-26
Systems and methods for detecting defects on a wafer Grant 8,467,047 - Chen , et al. June 18, 2	2013-06-18
Systems and Methods for Detecting Defects on a Wafer App 20120268735 - Chen; Lu ; et al.	2012-10-25
Systems and methods for detecting defects on a wafer Grant 8,223,327 - Chen , et al. July 17, 2	2012-07-17
Data Perturbation for Wafer Inspection or Metrology Setup App 20120116733 - Thattaisundaram; Govind ; et al.	2012-05-10
Computer-implemented methods, carrier media, and systems for selecting polarization settings for an inspection system Grant 8,049,877 - Wallingford , et al. November 1, 2	2011-11-01
Systems And Methods For Detecting Defects On A Wafer App 20100188657 - Chen; Lu ; et al.	2010-07-29
Computer-implemented Methods, Carrier Media, And Systems For Selecting Polarization Settings For An Inspection System App 20090284733 - Wallingford; Richard ; et al.	2009-11-19
Acoustical heat shield Grant 6,966,402 - Matias , et al. November 22, 2	2005-11-22
Acoustical heat shield App 20040238276 - Matias, Calin ; et al.	2004-12-02

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.