loadpatents
name:-0.019932985305786
name:-0.018912076950073
name:-0.00052905082702637
KINNEY; Patrick D. Patent Filings

KINNEY; Patrick D.

Patent Applications and Registrations

Patent applications and USPTO patent grants for KINNEY; Patrick D..The latest application filed is for "methods and systems for in situ calibration of imaging in biological analysis".

Company Profile
0.13.15
  • KINNEY; Patrick D. - Hayward CA
  • Kinney; Patrick D. - San Leandro CA
  • Kinney; Patrick D. - Coon Rapids MN
  • Kinney; Patrick D. - Santa Clara CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Methods and Systems for In Situ Calibration of Imaging in Biological Analysis
App 20150177061 - KINNEY; Patrick D. ;   et al.
2015-06-25
Methods and Systems for In Situ Calibration of Imaging in Biological Analysis
App 20150060643 - KINNEY; Patrick D. ;   et al.
2015-03-05
Methods and assemblies for collecting liquid by centrifugation
Grant 8,602,958 - Kinney , et al. December 10, 2
2013-12-10
Methods and Systems for In Situ Calibration of Imaging in Biological Analysis
App 20110254963 - KINNEY; Patrick D. ;   et al.
2011-10-20
Heated Cover Methods And Technology
App 20110164862 - Hirano; Kirk M. ;   et al.
2011-07-07
Methods and systems for in situ calibration of imaging in biological analysis
Grant 7,928,354 - Kinney , et al. April 19, 2
2011-04-19
Methods for monitoring polymerase chain reactions
Grant 7,875,425 - Gunstream , et al. January 25, 2
2011-01-25
Methods and Systems for In Situ Calibration of Imaging in Biological Analysis
App 20090230294 - Kinney; Patrick D. ;   et al.
2009-09-17
Methods and systems for in situ validation of imaging in biological analysis
Grant 7,541,567 - Kinney , et al. June 2, 2
2009-06-02
Methods, Software, and Apparatus for Focusing an Optical System Using Computer Image Analysis
App 20080285879 - Kinney; Patrick D. ;   et al.
2008-11-20
Methods, software, and apparatus for focusing an optical system using computer image analysis
Grant 7,394,943 - Kinney , et al. July 1, 2
2008-07-01
Heated Cover Methods And Technology
App 20080000892 - Hirano; Kirk M. ;   et al.
2008-01-03
Device for monitoring polymerase chain reactions
App 20070105126 - Gunstream; Stephen J. ;   et al.
2007-05-10
Methods and Systems for In Situ Calibration of Imaging in Biological Analysis
App 20070002314 - Kinney; Patrick D. ;   et al.
2007-01-04
Method of extracting intensity data from digitized image
App 20060291706 - Gunstream; Stephen J. ;   et al.
2006-12-28
Methods and systems for in situ calibration of imaging in biological analysis
Grant 7,045,756 - Kinney , et al. May 16, 2
2006-05-16
Methods And Systems For In Situ Calibration Of Imaging In Biological Analysis
App 20060038109 - Kinney; Patrick D. ;   et al.
2006-02-23
Sealing cover and dye compatibility selection
App 20060029948 - Lim; Gary ;   et al.
2006-02-09
Methods, software, and apparatus for focusing an optical system using computer image analysis
App 20060001955 - Kinney; Patrick D. ;   et al.
2006-01-05
Optical method and apparatus for inspecting large area planar objects
Grant 6,809,809 - Kinney , et al. October 26, 2
2004-10-26
Optical method and apparatus for inspecting large area planar objects
App 20040012775 - Kinney, Patrick D. ;   et al.
2004-01-22
Optical method and apparatus for inspecting large area planar objects
Grant 6,630,996 - Rao , et al. October 7, 2
2003-10-07
Optical method and apparatus for inspecting large area planar objects
App 20020088952 - Rao, Nagaraja P. ;   et al.
2002-07-11
Method and apparatus for selectively marking a semiconductor wafer
Grant 6,122,562 - Kinney , et al. September 19, 2
2000-09-19
Method and apparatus for transforming a substrate coordinate system into a wafer analysis tool coordinate system
Grant 5,985,680 - Singhal , et al. November 16, 1
1999-11-16
Optical inspection module and method for detecting particles and defects on substrates in integrated process tools
Grant 5,909,276 - Kinney , et al. June 1, 1
1999-06-01
Method of particle analysis on a mirror wafer
Grant 5,267,017 - Uritsky , et al. November 30, 1
1993-11-30

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