loadpatents
name:-0.0074269771575928
name:-0.0061490535736084
name:-0.00036001205444336
Kindt; Johannes H. Patent Filings

Kindt; Johannes H.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kindt; Johannes H..The latest application filed is for "cleaning station for atomic force microscope".

Company Profile
0.6.5
  • Kindt; Johannes H. - Ettlingen DE
  • Kindt; Johannes H. - Ehlingen DE
  • Kindt; Johannes H. - Santa Barbara CA
  • Kindt; Johannes H. - Santa Barabara CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Cleaning station for atomic force microscope
Grant 8,782,811 - Kindt , et al. July 15, 2
2014-07-15
Cleaning Station for Atomic Force Microscope
App 20120297510 - Kindt; Johannes H. ;   et al.
2012-11-22
Fast-scanning SPM and method of operating same
Grant 7,770,231 - Prater , et al. August 3, 2
2010-08-03
Scanner for probe microscopy
Grant 7,555,941 - Hansma , et al. July 7, 2
2009-07-07
Fast-Scanning SPM and Method of Operating Same
App 20090032706 - Prater; Craig ;   et al.
2009-02-05
Scanner for probe microscopy
App 20080078240 - Hansma; Paul K. ;   et al.
2008-04-03
Scanner for probe microscopy
Grant 7,278,298 - Hansma , et al. October 9, 2
2007-10-09
Scanner for probe microscopy
App 20060112760 - Hansma; Paul K. ;   et al.
2006-06-01
Measurement head for atomic force microscopy and other applications
Grant 6,871,527 - Hansma , et al. March 29, 2
2005-03-29
Measurement head for atomic force microscopy and other applications
App 20030015653 - Hansma, Paul K. ;   et al.
2003-01-23

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