Kimura; Maki
Patent Applications and Registrations
Patent applications and USPTO patent grants for Kimura; Maki.The latest application filed is for "charged particle microscope system and measurement method using same".
- Kimura; Maki - Tokyo JP
- Kimura; Maki - Aomori JP
| Patent | Date |
|---|---|
| Pattern evaluation method and pattern evaluation device Grant 9,488,815 - Miyamoto , et al. November 8, 2 | 2016-11-08 |
| Charged Particle Microscope System and Measurement Method Using Same App 20150235804 - Osaki; Mayuka ; et al. | 2015-08-20 |
| Pattern Evaluation Method And Pattern Evaluation Device App 20140320627 - Miyamoto; Atsushi ; et al. | 2014-10-30 |
| Information processing method and system for reservation Grant 7,136,822 - Kimura , et al. November 14, 2 | 2006-11-14 |
| Information processing method and system for reservation App 20030097283 - Kimura, Maki ; et al. | 2003-05-22 |
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