KIM; Sung Ok

Patent Applications and Registrations

Patent applications and USPTO patent grants for KIM; Sung Ok.The latest application filed is for "semiconductor package test apparatus and method".

Company Profile

0.9.11

KIM; Sung Ok - Asan-si KR
Kim; Sung Ok - Yongin-si KR
Kim; Sung-Ok - Chungcheongnam KR
KIM; Sung-Ok - Chungcheongnam-do KR
Kim; Sung Ok - Cheonan KR
Kim, Sung Ok - Cheonan-city KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor Package Test Apparatus And Method App 20220057444 - KIM; Sung Ok ; et al.	2022-02-24
Display apparatus Grant 9,880,418 - Lee , et al. January 30, 2	2018-01-30
Display Apparatus App 20160223866 - LEE; Jae Kwon ; et al.	2016-08-04
Test apparatus having multiple head boards at one handler and its test method Grant 7,602,172 - Chung , et al. October 13, 2	2009-10-13
Method Of Testing Semiconductor Device App 20090140761 - KIM; Sung-Ok ; et al.	2009-06-04
Test Apparatus Having Multiple Test Sites At One Handler And Its Test Method App 20080197874 - CHUNG; Ae-Yong ; et al.	2008-08-21
Test system of semiconductor device having a handler remote control and method of operating the same Grant 7,408,339 - Chung , et al. August 5, 2	2008-08-05
Test apparatus having multiple test sites at one handler and its test method Grant 7,378,864 - Chung , et al. May 27, 2	2008-05-27
Test System Of Semiconductor Device Having A Handler Remote Control And Method Of Operating The Same App 20070290707 - CHUNG; Ae-Yong ; et al.	2007-12-20
Test system of semiconductor device having a handler remote control and method of operating the same Grant 7,230,417 - Chung , et al. June 12, 2	2007-06-12
Test system of semiconductor device having a handler remote control and method of operating the same App 20060158211 - Chung; Ae-Yong ; et al.	2006-07-20
Method for electrical testing of semiconductor package that detects socket defects in real time Grant 6,960,908 - Chung , et al. November 1, 2	2005-11-01
Test apparatus having multiple test sites at one handler and its test method App 20050168236 - Chung, Ae-Yong ; et al.	2005-08-04
Method for testing a remnant batch of semiconductor devices Grant 6,922,050 - Chung , et al. July 26, 2	2005-07-26
Test apparatus having multiple test sites at one handler and its test method Grant 6,903,567 - Chung , et al. June 7, 2	2005-06-07
System and method for automatically analyzing and managing loss factors in test process of semiconductor integrated circuit devices Grant 6,857,090 - Lee , et al. February 15, 2	2005-02-15
Method for testing a remnant batch of semiconductor devices App 20040253753 - Chung, Ae-yong ; et al.	2004-12-16
Method for electrical testing of semiconductor package that detects socket defects in real time App 20040207387 - Chung, Ae-yong ; et al.	2004-10-21
Test apparatus having multiple test sites at one handler and its test method App 20040061491 - Chung, Ae-Yong ; et al.	2004-04-01
System and method for automatically analyzing and managing loss factors in test process of semiconductor integrated circuit devices App 20030005376 - Lee, Kyu Sung ; et al.	2003-01-02

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