Kim; Souk

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kim; Souk.The latest application filed is for "methods of manufacturing semiconductor device".

Company Profile

9.8.9

Kim; Souk - Seoul KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods of manufacturing semiconductor device Grant 11,181,831 - Lee , et al. November 23, 2	2021-11-23
Semiconductor pattern detecting apparatus Grant 11,017,525 - Ahn , et al. May 25, 2	2021-05-25
Method of inspecting semiconductor wafer, inspection system for performing the same, and method of fabricating semiconductor device using the same Grant 11,004,712 - Ryu , et al. May 11, 2	2021-05-11
Methods Of Manufacturing Semiconductor Device App 20200194317 - Lee; Kyoung-hwan ; et al.	2020-06-18
Measuring Apparatus And Substrate Analysis Method Using The Same App 20200182783 - JUN; Sunhong ; et al.	2020-06-11
Semiconductor Pattern Detecting Apparatus App 20200184618 - AHN; Jae Hyung ; et al.	2020-06-11
Method Of Inspecting Semiconductor Wafer, Inspection System For Performing The Same, And Method Of Fabricating Semiconductor Dev App 20200176292 - RYU; Sung Yoon ; et al.	2020-06-04
Optical measuring method for semiconductor wafer including a plurality of patterns and method of manufacturing semiconductor device using optical measurement Grant 10,410,937 - Park , et al. Sept	2019-09-10
Method of inspecting wafer using electron beam Grant 10,373,796 - Kim , et al.	2019-08-06
Optical Measuring Method For Semiconductor Wafer Including A Plurality Of Patterns And Method Of Manufacturing Semiconductor Dev App 20190181062 - PARK; Jang Ik ; et al.	2019-06-13
Method of manufacturing a semiconductor device using semiconductor measurement system Grant 9,583,402 - Ryu , et al. February 28, 2	2017-02-28
Method of Inspecting Wafer Using Electron Beam App 20160293379 - Kim; Souk ; et al.	2016-10-06
Apparatus for measuring thickness of thin film, system including the apparatus, and method for measuring thickness of thin film Grant 9,417,055 - Ryu , et al. August 16, 2	2016-08-16
Apparatus For Measuring Thickness Of Thin Film, System Including The Apparatus, And Method For Measuring Thickness Of Thin Film App 20160061583 - RYU; Sung-Yoon ; et al.	2016-03-03
Method Of Manufacturing A Semiconductor Device Using Semiconductor Measurement System App 20160027707 - RYU; Sung Yoon ; et al.	2016-01-28
Image processing method and image processing apparatus using time axis low band pass filter Grant 9,148,549 - Lim , et al. September 29, 2	2015-09-29
Image Processing Method And Image Processing Apparatus Using Time Axis Low Band Pass Filter App 20140085454 - LIM; Chang Kue ; et al.	2014-03-27

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