Kim; Kye-Weon

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kim; Kye-Weon.The latest application filed is for "method and apparatus for controlling light intensity and for exposing a semiconductor substrate".

Company Profile

0.6.9

Kim; Kye-Weon - Suwon-si KR
Kim; Kye-Weon - Gyeonggi-do KR
Kim; Kye-Weon - Suwon KR
Kim, Kye-Weon - Suwon-city KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and apparatus for inspecting substrate pattern Grant 7,385,689 - Kim , et al. June 10, 2	2008-06-10
Apparatus and method for measuring a thickness of a substrate Grant 7,355,729 - Park , et al. April 8, 2	2008-04-08
Method And Apparatus For Controlling Light Intensity And For Exposing A Semiconductor Substrate App 20070190438 - KIM; Kye-Weon ; et al.	2007-08-16
Test Pattern And Method For Measuring Silicon Etching Depth App 20070184565 - PARK; Hwan-Shik ; et al.	2007-08-09
Adsorption apparatus, semiconductor device manufacturing facility comprising the same, and method of recycling perfulorocompounds App 20070028771 - Shin; Ji-Young ; et al.	2007-02-08
Method and apparatus for obtaining an image using a selective combination of wavelengths of light Grant 7,081,952 - Kim , et al. July 25, 2	2006-07-25
Method and apparatus for inspecting substrate pattern App 20060039598 - Kim; Kye-Weon ; et al.	2006-02-23
Apparatus and method for measuring a thickness of a substrate App 20050083539 - Park, Hwan-Shik ; et al.	2005-04-21
Method and apparatus for numerically analyzing grain growth on semiconductor wafer using SEM image Grant 6,870,948 - Jun , et al. March 22, 2	2005-03-22
Method for measuring step difference in a semiconductor device and apparatus for performing the same Grant 6,850,332 - Jun , et al. February 1, 2	2005-02-01
Method and apparatus for obtaining an image using a selective combination of wavelengths of light App 20040109157 - Kim, Kye-Weon ; et al.	2004-06-10
Method for inspecting a polishing pad in a semiconductor manufacturing process, an apparatus for performing the method, and a polishing device adopting the apparatus Grant 6,650,408 - Jun , et al. November 18, 2	2003-11-18
Method for measuring step difference in a semiconductor device and apparatus for performing the same App 20020074518 - Jun, Chung-Sam ; et al.	2002-06-20
Method and apparatus for numerically analyzing grain growth on semiconductor wafer using SEM image App 20020072133 - Jun, Chung-Sam ; et al.	2002-06-13
Method for inspecting a polishing pad in a semiconductor manufacturing process, an apparatus for performing the method, and a polishing device adopting the apparatus App 20020063860 - Jun, Chung-Sam ; et al.	2002-05-30

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