Kim; Joo Chan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kim; Joo Chan.The latest application filed is for "formation of raised source/drain stuctures in nfet with embedded sige in pfet".

Company Profile

0.10.14

Kim; Joo Chan - Fishkill NY
Kim; Joo-chan - Gyeonggi-do KR
Kim; Joo-Chan - Suwon-si KR
Kim; Joo-chan - Seoul KR
Kim; Joo-Chan - Suwon-city KR
Kim; Joo-Chan - Suwon KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Formation of raised source/drain structures in NFET with embedded SiGe in PFET Grant 8,288,825 - Chong , et al. October 16, 2	2012-10-16
Embedded stressor structure and process Grant 7,939,413 - Chong , et al. May 10, 2	2011-05-10
Methods of forming integrated circuit devices having ion-cured electrically insulating layers therein Grant 7,838,390 - Kim , et al. November 23, 2	2010-11-23
Formation Of Raised Source/drain Stuctures In Nfet With Embedded Sige In Pfet App 20100219485 - CHONG; Yung Fu ; et al.	2010-09-02
Method Of Forming A Semiconductor Device Having Selective Stress Relaxation Of Etch Stop Layer App 20100171182 - Shin; Dong-Suk ; et al.	2010-07-08
Formation of raised source/drain structures in NFET with embedded SiGe in PFET Grant 7,718,500 - Chong , et al. May 18, 2	2010-05-18
Flash memory device having a split gate Grant 7,564,092 - Ryu , et al. July 21, 2	2009-07-21
Methods of Forming Integrated Circuit Devices Having Ion-Cured Electrically Insulating Layers Therein App 20090098706 - Kim; Jun-jung ; et al.	2009-04-16
Strained Semiconductor Device and Method of Making Same App 20090050972 - Lindsay; Richard ; et al.	2009-02-26
Strained semiconductor device and method of making same App 20080057636 - Lindsay; Richard ; et al.	2008-03-06
Formation of raised source/drain structures in NFET with embedded SiGe in PFET App 20070138570 - Chong; Yung Fu ; et al.	2007-06-21
Embedded stressor structure and process App 20070132038 - Chong; Yung Fu ; et al.	2007-06-14
Semiconductor device having a measuring pattern and a method of measuring the semiconductor device using the measuring pattern Grant 7,195,933 - Park , et al. March 27, 2	2007-03-27
Flash memory device having a split gate App 20070026613 - Ryu; Eui-youl ; et al.	2007-02-01
Flash memory device having a split gate and method of manufacturing the same Grant 7,094,646 - Ryu , et al. August 22, 2	2006-08-22
Split gate type flash memory device and method of manufacturing the same App 20060001077 - Ryu; Eui-youl ; et al.	2006-01-05
Method of manufacturing split-gate memory Grant 6,977,200 - Kim , et al. December 20, 2	2005-12-20
Flash memory device having a split gate and method of manufacturing the same App 20050250282 - Ryu, Eui-youl ; et al.	2005-11-10
Semiconductor device having a measuring pattern and a method of measuring the semiconductor device using the measuring pattern App 20050230786 - Park, Sang-Wook ; et al.	2005-10-20
Semiconductor device having a measuring pattern and a method of measuring the semiconductor device using the measuring pattern Grant 6,924,505 - Park , et al. August 2, 2	2005-08-02
Method of manufacturing split-gate memory App 20050112821 - Kim, Yong-hee ; et al.	2005-05-26
Semiconductor device having a measuring pattern and a method of measuring the semiconductor device using the measuring pattern App 20050035433 - Park, Sang-Wook ; et al.	2005-02-17
Method of manufacturing split gate flash memory device Grant 6,800,525 - Ryu , et al. October 5, 2	2004-10-05
Method of manufacturing split gate flash memory device App 20040027861 - Ryu, Eui-Youl ; et al.	2004-02-12

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