Kim; Jong-An

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kim; Jong-An.The latest application filed is for "methods for nondestructive measurements of thickness of underlying layers".

Company Profile

3.19.17

Kim; Jong-An - Gwangju KR
Kim; Jong-an - Seongnam-si KR
Kim; Jong An - Daejeon KR
Kim; Jong-An - Seoul N/A KR
KIM; Jong-an - Gwacheon-si KR
Kim; Jong-An - Suwon-si KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatus for controlling ESS according to transient stability state and method thereof Grant 11,043,814 - Kim , et al. June 22, 2	2021-06-22
Methods for nondestructive measurements of thickness of underlying layers Grant 10,989,520 - Oh , et al. April 27, 2	2021-04-27
Methods For Nondestructive Measurements Of Thickness Of Underlying Layers App 20200208964 - OH; Duck-mahn ; et al.	2020-07-02
Apparatus For Controlling Ess According To Transient Stability State And Method Thereof App 20200185920 - KIM; Tae-Ok ; et al.	2020-06-11
Method for preparing porous alumina Grant 9,045,349 - Suh , et al. June 2, 2	2015-06-02
Method for generating standard file based on steganography technology and apparatus and method for validating integrity of metadata in the standard file Grant 8,769,292 - Kim , et al. July 1, 2	2014-07-01
Search User Interface App 20140172816 - LEE; Ju-yong ; et al.	2014-06-19
Method For Preparing Porous Alumina App 20140161716 - Suh; Jeong Kwon ; et al.	2014-06-12
Apparatus and method to inspect defect of semiconductor device Grant 8,546,154 - Shin , et al. October 1, 2	2013-10-01
Mask and manufacturing method of a semiconductor device and a thin film transistor array panel using the mask Grant 8,153,339 - Kim , et al. April 10, 2	2012-04-10
Apparatus And Method To Inspect Defect Of Semiconductor Device App 20120080597 - SHIN; Ji-Young ; et al.	2012-04-05
Method of detecting defects in patterns on semiconductor substrate by comparing second image with reference image after acquiring second image from first image and apparatus for performing the same Grant 8,126,258 - Yang , et al. February 28, 2	2012-02-28
Method of detecting defects of patterns on a semiconductor substrate and apparatus for performing the same Grant 8,055,056 - Kim , et al. November 8, 2	2011-11-08
Method for detecting defects in a substrate having a semiconductor device thereon Grant 8,055,057 - Kang , et al. November 8, 2	2011-11-08
Method of analyzing a wafer sample Grant 8,050,488 - Kim , et al. November 1, 2	2011-11-01
Apparatus and method to inspect defect of semiconductor device Grant 8,034,640 - Shin , et al. October 11, 2	2011-10-11
Mask And Manufacturing Method Of A Semiconductor Device And A Thin Film Transistor Array Panel Using The Mask App 20100261102 - KIM; Jong-An ; et al.	2010-10-14
Wafer inspecting method Grant 7,804,591 - Kim , et al. September 28, 2	2010-09-28
Mask and manufacturing method of a semiconductor device and a thin film transistor array panel using the mask Grant 7,767,506 - Kim , et al. August 3, 2	2010-08-03
Apparatus And Method To Inspect Defect Of Semiconductor Device App 20100136717 - SHIN; Ji-Young ; et al.	2010-06-03
Optical inspection tool having lens unit with multiple beam paths for detecting surface defects of a substrate and methods of using same Grant 7,728,966 - Kim , et al. June 1, 2	2010-06-01
Mask and Manufacturing Method of a Semiconductor Device and a Thin Film Transistor Array Panel Using the Mask App 20090053863 - KIM; Jong-An ; et al.	2009-02-26
Mask and manufacturing method of a semiconductor device and a thin film transistor array panel using the mask Grant 7,449,352 - Kim , et al. November 11, 2	2008-11-11
Method For Generating Standard File Based On Steganography Technology And Apparatus And Method For Validating Integrity Of Metadata In The Standard File App 20080229099 - Kim; Jong-Heum ; et al.	2008-09-18
Method Of Analyzing A Wafer Sample App 20080219547 - Kim; Jong-An ; et al.	2008-09-11
Method for detecting defects in a substrate having a semiconductor device thereon App 20080172196 - Kang; Moon-Shik ; et al.	2008-07-17
Method of detecting defects in patterns and apparatus for performing the same App 20080112608 - Yang; Yu-Sin ; et al.	2008-05-15
Method Of Detecting Defects Of Patterns On A Semiconductor Substrate And Apparatus For Performing The Same App 20080107329 - Kim; Jong-An ; et al.	2008-05-08
Wafer Inspecting Method App 20080049219 - Kim; Ji-Hye ; et al.	2008-02-28
Optical Inspection Tool Having Lens Unit With Multiple Beam Paths For Detecting Surface Defects Of A Substrate And Methods Of Using Same App 20070013901 - Kim; Jong-An ; et al.	2007-01-18
Mask and manufacturing method of a semiconductor device and a thin film transistor array panel using the mask App 20060128054 - Kim; Jong-An ; et al.	2006-06-15
Manufacturing method of granulated complex molecular sieve composition having multi-functions Grant 6,074,974 - Lee , et al. June 13, 2	2000-06-13

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