Kim; Ilyoung

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kim; Ilyoung.The latest application filed is for "electronic device and method for compensating for depth error according to modulation frequency".

Company Profile

2.9.8

Kim; Ilyoung - Gyeonggi-do KR
Kim; Ilyoung - Suwon-si KR
Kim; Ilyoung - Skillman NJ
Kim, Ilyoung - Plainsboro NJ
Kim; Ilyoung - Middlesex NJ

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Camera assembly and electronic device including same Grant 11,445,098 - Kim , et al. September 13, 2	2022-09-13
Electronic Device And Method For Compensating For Depth Error According To Modulation Frequency App 20220091241 - KIM; Ilyoung ; et al.	2022-03-24
Electronic device and method for controlling actuator by utilizing same Grant 11,216,070 - Bae , et al. January 4, 2	2022-01-04
Camera Assembly And Electronic Device Including Same App 20210250509 - KIM; Ilyoung ; et al.	2021-08-12
Cross-talk Prevention Structure Of Electronic Device For Measuring Distance To External Object App 20200319306 - KIM; Ilyoung ; et al.	2020-10-08
Electronic Device And Method For Controlling Actuator By Utilizing Same App 20190354186 - BAE; Yudong ; et al.	2019-11-21
Generalized BIST for multiport memories Grant 8,201,032 - Evans , et al. June 12, 2	2012-06-12
Generalized Bist For Multiport Memories App 20080016418 - Evans; Donald A. ; et al.	2008-01-17
Generalized BIST for multiport memories App 20060090106 - Evans; Donald A. ; et al.	2006-04-27
Built-in self-test hierarchy for an integrated circuit App 20040128600 - Kim, Ilyoung ; et al.	2004-07-01
Built-in-self-test And Self-repair Methods And Devices For Computer Memories Comprising A Reconfiguration Memory Device App 20020019957 - HIGGINS, FRANK P. ; et al.	2002-02-14
Built-in self-test controlled by a token network and method Grant 6,237,123 - Kim , et al. May 22, 2	2001-05-22
Method and system for testing multiport memories Grant 6,216,241 - Fenstermaker , et al. April 10, 2	2001-04-10
Optimized built-in self-test method and apparatus for random access memories Grant 6,205,564 - Kim , et al. March 20, 2	2001-03-20
Testing method and apparatus for first-in first-out memories Grant 6,108,802 - Kim , et al. August 22, 2	2000-08-22
Built-in self-test in a plurality of stages controlled by a token passing network and method Grant 5,978,947 - Kim , et al. November 2, 1	1999-11-02
Method and apparatus for testing large embedded counters Grant 5,473,651 - Guzinski , et al. December 5, 1	1995-12-05

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