Patent | Date |
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Memory System, Data Processing System And Method Of Operating The Same App 20220180915 - KIM; Hyeong Soo ;   et al. | 2022-06-09 |
Data Processing System And Method Of Operating The Same App 20190341097 - KIM; Hyeong Soo ;   et al. | 2019-11-07 |
Mask and method of fabricating the same Grant 8,057,965 - Kim November 15, 2 | 2011-11-15 |
Method For Manufacturing Semiconductor Device App 20100099046 - Kim; Hyeong Soo ;   et al. | 2010-04-22 |
Mask and Method of Fabricating the Same App 20090170013 - Kim; Hyeong Soo | 2009-07-02 |
Liquid Composition for Immersion Lithography and Lithography Method Using the Same App 20080176047 - Kong; Keun Kyu ;   et al. | 2008-07-24 |
Semiconductor device and method for fabricating the same Grant 7,339,211 - Kim , et al. March 4, 2 | 2008-03-04 |
Process for forming a fine pattern using a top-coating composition for a photoresist and product formed by same Grant 7,329,477 - Jung , et al. February 12, 2 | 2008-02-12 |
Semiconductor Device And Method For Fabricating The Same App 20070085128 - KIM; Dong-Sauk ;   et al. | 2007-04-19 |
Top-coating composition for photoresist and process for forming fine pattern using the same Grant 6,984,482 - Jung , et al. January 10, 2 | 2006-01-10 |
Liquid composition for immersion lithography and lithography method using the same App 20050260528 - Kong, Keun Kyu ;   et al. | 2005-11-24 |
Process for forming a fine pattern using a top-coating composition for a photoresist and product formed by same App 20050069816 - Jung, Jae Chang ;   et al. | 2005-03-31 |
Alignment mark for aligning wafer of semiconductor device Grant 6,864,590 - Bae , et al. March 8, 2 | 2005-03-08 |
Semiconductor device and method for fabricating the same App 20050018525 - Kim, Dong-Sauk ;   et al. | 2005-01-27 |
Alignment Mark For Aligning Wafer Of Semiconductor Device App 20040261282 - Bae, Sang-Man ;   et al. | 2004-12-30 |
Reflection-inhibiting resin used in process for forming photoresist pattern Grant 6,797,451 - Hong , et al. September 28, 2 | 2004-09-28 |
Process for forming a photoresist pattern comprising alkaline treatment Grant 6,699,644 - Lee , et al. March 2, 2 | 2004-03-02 |
Photoresist composition for resist flow process and process for forming a contact hole using the same Grant 6,627,384 - Kim , et al. September 30, 2 | 2003-09-30 |
Top-coating composition for photoresist and process for forming fine pattern using the same App 20030108815 - Jung, Jae Chang ;   et al. | 2003-06-12 |
Reflection-inhibiting resinn used in process for forming photoresist pattern App 20030018150 - Hong, Sung Eun ;   et al. | 2003-01-23 |
Anti reflective coating polymers and the preparation method thereof Grant 6,492,441 - Hong , et al. December 10, 2 | 2002-12-10 |
Anti reflective coating polymers and the preparation method thereof App 20020120070 - Hong, Sung-Eun ;   et al. | 2002-08-29 |
Photoresist cross-linker and photoresist composition comprising the same Grant 6,368,773 - Jung , et al. April 9, 2 | 2002-04-09 |
Novel photoresist polymers, and photoresist compositions containing the same App 20020018960 - Lee, Geun Su ;   et al. | 2002-02-14 |
Novel photoresist cross-linker and photoresist composition comprising the same App 20020019560 - Kong, Keun Kyu ;   et al. | 2002-02-14 |
Photoresist cross-linker and photoresist composition comprising the same Grant 6,312,868 - Kong , et al. November 6, 2 | 2001-11-06 |
Mask for use in stitching exposure process Grant 5,922,495 - Kim July 13, 1 | 1999-07-13 |
Method for forming micro patterns of semiconductor devices Grant 5,821,034 - Kim , et al. October 13, 1 | 1998-10-13 |
Method of removing a silylated or germanium implanted photoresist Grant 5,491,047 - Kim , et al. February 13, 1 | 1996-02-13 |