KIM; Hwan Bin
Patent Applications and Registrations
Patent applications and USPTO patent grants for KIM; Hwan Bin.The latest application filed is for "substrate type sensor for measuring horizontality of substrate support member provided in atmosphere accompanied by temperature change, method for measuring horizontality of substrate support member by using the same, and non-transitory computer readable medium".
- KIM; Hwan Bin - Chungcheongnam-do KR
- KIM; HWAN BIN - Asan-si KR
| Patent | Date |
|---|---|
| Substrate Type Sensor For Measuring Horizontality Of Substrate Support Member Provided In Atmosphere Accompanied By Temperature Change, Method For Measuring Horizontality Of Substrate Support Member By Using The Same, And Non-transitory Computer Readable Medium App 20220205782 - CHOI; Young Seop ; et al. | 2022-06-30 |
| Unit For Removing Adhesive Layer And Method Using The Same App 20220088644 - OH; SEUNG HOON ; et al. | 2022-03-24 |
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