Kim; Hong-Beom

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kim; Hong-Beom.The latest application filed is for "board assembly".

Company Profile

0.9.10

Kim; Hong-Beom - Daegu KR
Kim; Hong-Beom - Hwaseong-si KR
Kim; Hong-beom - Suwon-si KR
Kim; Hong-Beom - Gyeonggi-do KR
Kim; Hong-Beom - Suwon KR
Kim, Hong-Beom - US
Kim, Hong-Beom - Suwon-city KR
Kim; Hong-beom - Yongin KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Board assembly Grant 9,526,162 - Jung , et al. December 20, 2	2016-12-20
Method of testing a semiconductor memory device Grant 8,902,673 - Kim , et al. December 2, 2	2014-12-02
Board Assembly App 20140307410 - JUNG; Min-Su ; et al.	2014-10-16
Semiconductor Memory Device And Method Of Screening The Same App 20130235685 - Kim; Hong Beom ; et al.	2013-09-12
Method Of Testing A Semiconductor Memory Device App 20120257461 - KIM; Hong-Beom ; et al.	2012-10-11
Integrated circuit apparatus having improved test circuit and method of testing the integrated circuit apparatus Grant 7,634,702 - Kim , et al. December 15, 2	2009-12-15
Parallel bit testing device and method Grant 7,526,688 - Kim April 28, 2	2009-04-28
Semiconductor memory device capable of accessing all memory cells Grant 7,370,237 - Kim , et al. May 6, 2	2008-05-06
Semiconductor memory devices and a method thereof App 20070047347 - Byun; Gyung-Su ; et al.	2007-03-01
Semiconductor memory device and test method of the same Grant 6,990,617 - In , et al. January 24, 2	2006-01-24
Integrated circuit apparatus having improved test circuit and method of testing the integrated circuit apparatus App 20060013046 - Kim; Hong-beom ; et al.	2006-01-19
Parallel bit testing device and method App 20050257107 - Kim, Hong-Beom	2005-11-17
Apparatus and method for testing a plurality of semiconductor chips Grant 6,888,366 - Kim , et al. May 3, 2	2005-05-03
Method for transmitting and receiving signals in semiconductor device and semiconductor device thereof App 20050083217 - Kim, Hong-Beom ; et al.	2005-04-21
Semiconductor memory device capable of accessing all memory cells App 20040216006 - Kim, Hong-Beom ; et al.	2004-10-28
Semiconductor memory device and test method of the same App 20040090837 - In, Sung-Hwan ; et al.	2004-05-13
Semiconductor chip test system and test method thereof App 20040041579 - Kim, Hong-Beom ; et al.	2004-03-04
Bonding pad in semiconductor device Grant 5,804,883 - Kim , et al. September 8, 1	1998-09-08

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