Kim; Ho-Chul

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kim; Ho-Chul.The latest application filed is for "apparatus and method for generating extreme ultra violet radiation".

Company Profile

0.10.15

Kim; Ho-Chul - Seoul KR
Kim; Ho Chul - Guro-gu KR
Kim; Ho-chul - Daejeon KR
Kim; Ho Chul - Yuseong-gu KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatus And Method For Generating Extreme Ultra Violet Radiation App 20140264089 - Kim; In-Sung ; et al.	2014-09-18
Automation method for computerized tomography image analysis using automated calculation of evaluation index of degree of thoracic deformation based on automatic initialization, and record medium and apparatus Grant 8,594,409 - Kim , et al. November 26, 2	2013-11-26
Automation Method For Computerized Tomography Image Analysis Using Automated Calculation Of Evaluation Index Of Degree Of Thoracic Deformation Based On Automatic Initialization, And Record Medium And Apparatus App 20120308110 - Kim; Sung Min ; et al.	2012-12-06
System for testing performance of array ultrasound transducer Grant 8,296,082 - Kim , et al. October 23, 2	2012-10-23
Optical system for spatially controlling light polarization and method for manufacturing the same Grant 7,903,530 - Kim March 8, 2	2011-03-08
Photomask having a test pattern that includes separate features for different printed critical dimensions to correlate magnitude and direction of defocus Grant 7,855,037 - Kim December 21, 2	2010-12-21
System For Testing Performance Of Array Ultrasound Transducer App 20100313628 - Kim; Yong-tae ; et al.	2010-12-16
Systems And Methods For Detecting Focus Variation In Photolithograph Process Using Test Features Printed From Photomask Test Pattern Images App 20100081068 - Kim; Ho-Chul	2010-04-01
Apparatus Using Focused Ultrasound Wave By Controlling Electronic Signals And Using Method Thereof App 20100076352 - Kim; Yong Tae ; et al.	2010-03-25
Methods for monitoring and adjusting focus variation in a photolithographic process using test features printed from photomask test pattern images; and machine readable program storage device having instructions therefore Grant 7,642,019 - Kim January 5, 2	2010-01-05
Stencil mask having main and auxiliary strut and method of forming the same Grant 7,635,547 - Kim , et al. December 22, 2	2009-12-22
Apparatus For Exposing A Substrate, Photomask And Modified Illuminating System Of The Apparatus, And Method Of Forming A Pattern On A Substrate Using The Apparatus App 20090180182 - KIM; Ho-Chul	2009-07-16
Stencil Mask Having Main And Auxiliary Strut And Method Of Forming The Same App 20080268353 - KIM; In-Sung ; et al.	2008-10-30
Stencil mask having main and auxiliary strut and method of forming the same Grant 7,384,711 - Kim , et al. June 10, 2	2008-06-10
Photomask structures providing improved photolithographic process windows and methods of manufacturing same App 20060234137 - Kim; Ho-Chul	2006-10-19
Systems and methods for detecting focus variation in photolithograph process using test features printed from photomask test pattern images App 20060234136 - Kim; Ho-Chul	2006-10-19
Focus monitoring masks having multiple phase shifter units and methods for fabricating the same App 20060115746 - Choi; Sung-Won ; et al.	2006-06-01
Apparatus for exposing a substrate, photomask and modified illuminating system of the apparatus, and method of forming a pattern on a substrate using the apparatus App 20060083996 - Kim; Ho-Chul	2006-04-20
Optical system for spatially controlling light polarization and method for manufacturing the same App 20060028957 - Kim; Ho-Chul	2006-02-09
Photomask for measuring lens aberration, method of manufacturing the same, and method of measuring lens aberration Grant 6,913,858 - Kim July 5, 2	2005-07-05
Method and system for measuring stray light Grant 6,900,887 - Kim May 31, 2	2005-05-31
Method and system for measuring stray light App 20050052651 - Kim, Ho-chul	2005-03-10
Stencil mask having main and auxiliary strut and method of forming the same App 20040265744 - Kim, In-Sung ; et al.	2004-12-30
Photomask for measuring lens aberration, method of manufacturing the same, and method of measuring lens aberration App 20030193656 - Kim, Ho-Chul	2003-10-16

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.