Kim; Gyu-Yeol

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kim; Gyu-Yeol.The latest application filed is for "test interface boards, test systems, and methods of operating test interface boards".

Company Profile

5.6.7

Kim; Gyu-Yeol - Hwaseong-si KR
Kim; Gyu-Yeol - Hwasung KR
KIM; Gyu-Yeol - Hwasung-City KR
Kim; Gyu-Yeol - Suwon-si KR
KIM; Gyu-Yeol - Gyeonggi-do KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Probe card and test apparatus including the same Grant 10,996,242 - Kim , et al. May 4, 2	2021-05-04
Probe card assembly Grant 10,935,574 - Kim , et al. March 2, 2	2021-03-02
Test interface boards, test systems, and methods of operating test interface boards Grant 10,811,118 - Joo , et al. October 20, 2	2020-10-20
Test Interface Boards, Test Systems, And Methods Of Operating Test Interface Boards App 20190378590 - JOO; SUNG-HO ; et al.	2019-12-12
Probe and probe card including the same Grant 10,309,987 - Kim , et al.	2019-06-04
Probe And Probe Card Including The Same App 20180299490 - KIM; Yu-Kyum ; et al.	2018-10-18
Probe Card Assembly App 20180224481 - KIM; Gyu Yeol ; et al.	2018-08-09
Probe Card And Test Apparatus Including The Same App 20180156842 - KIM; GYU-YEOL ; et al.	2018-06-07
Electrical signal transmission module, method of transmitting electric signals and electrical inspection apparatus having the same Grant 8,139,949 - Lee , et al. March 20, 2	2012-03-20
Electrical Signal Transmission Module, Method Of Transmitting Electric Signals And Electrical Inspection Apparatus Having The Same App 20090028571 - Lee; Sang-Hoon ; et al.	2009-01-29
Semiconductor Memory Device Capable Of Storing Data Of Various Patterns And Method Of Electrically Testing The Semiconductor Memory Device App 20080316846 - KIM; Gyu-Yeol ; et al.	2008-12-25
Semiconductor memory device capable of storing data of various patterns and method of electrically testing the semiconductor memory device Grant 7,433,252 - Kim , et al. October 7, 2	2008-10-07
Semiconductor memory device capable of storing data of various patterns and method of electrically testing the semiconductor memory device App 20060098506 - Kim; Gyu-Yeol ; et al.	2006-05-11

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