Kim; Dai Geun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kim; Dai Geun.The latest application filed is for "inkjet print head and manufacturing method thereof".

Company Profile

0.11.13

Kim; Dai Geun - Hwaseong-si KR
Kim; Dai-geun - Suwon-si KR
Kim; Dai-Geun - Yongin KR
Kim, Dai-Geun - Yongin-City KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Inkjet printer head and method to manufacture the same Grant 7,942,506 - Park , et al. May 17, 2	2011-05-17
Flash memory device having a split gate Grant 7,564,092 - Ryu , et al. July 21, 2	2009-07-21
Inkjet Print Head And Manufacturing Method Thereof App 20090027450 - PARK; Sung Joon ; et al.	2009-01-29
Inkjet Printer Head And Method To Manufacture The Same App 20090009562 - PARK; Sung Joon ; et al.	2009-01-08
Semiconductor device having a measuring pattern and a method of measuring the semiconductor device using the measuring pattern Grant 7,195,933 - Park , et al. March 27, 2	2007-03-27
Nonvolatile memory cells having split gate structure and methods of fabricating the same Grant 7,183,154 - Kim , et al. February 27, 2	2007-02-27
Nonvolatile memory cells having split gate structure and methods of fabricating the same Grant 7,180,124 - Kim , et al. February 20, 2	2007-02-20
Flash memory device having a split gate App 20070026613 - Ryu; Eui-youl ; et al.	2007-02-01
Flash memory device having a split gate and method of manufacturing the same Grant 7,094,646 - Ryu , et al. August 22, 2	2006-08-22
Split gate type flash memory device and method of manufacturing the same App 20060001077 - Ryu; Eui-youl ; et al.	2006-01-05
Flash memory device having a split gate and method of manufacturing the same App 20050250282 - Ryu, Eui-youl ; et al.	2005-11-10
Semiconductor device having a measuring pattern and a method of measuring the semiconductor device using the measuring pattern App 20050230786 - Park, Sang-Wook ; et al.	2005-10-20
Semiconductor device having a measuring pattern and a method of measuring the semiconductor device using the measuring pattern Grant 6,924,505 - Park , et al. August 2, 2	2005-08-02
Nonvolatile memory cells having split gate structure and methods of fabricating the same App 20050064655 - Kim, Jin-Woo ; et al.	2005-03-24
Nonvolatile memory cells having split gate structure and methods of fabricating the same App 20050056880 - Kim, Jin-Woo ; et al.	2005-03-17
Nonvolatile memory cells having split gate structure and methods of fabricating the same Grant 6,867,082 - Kim , et al. March 15, 2	2005-03-15
Semiconductor device having a measuring pattern and a method of measuring the semiconductor device using the measuring pattern App 20050035433 - Park, Sang-Wook ; et al.	2005-02-17
Nonvolatile memory cells having split gate structure and methods of fabricating the same App 20040207005 - Kim, Jin-Woo ; et al.	2004-10-21
Method of manufacturing split gate flash memory device Grant 6,800,525 - Ryu , et al. October 5, 2	2004-10-05
Nonvolatile memory cells having split gate structure and methods of fabricating the same Grant 6,753,571 - Kim , et al. June 22, 2	2004-06-22
Method for manufacturing flash memory device Grant 6,716,699 - Cho , et al. April 6, 2	2004-04-06
Method of manufacturing split gate flash memory device App 20040027861 - Ryu, Eui-Youl ; et al.	2004-02-12
Nonvolatile memory cells having split gate structure and methods of fabricating the same App 20030185073 - Kim, Jin-Woo ; et al.	2003-10-02
Method for manufacturing flash memory device App 20030155608 - Cho, Min-soo ; et al.	2003-08-21

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