Kim; Dae Sun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kim; Dae Sun.The latest application filed is for "semiconductor memory apparatus and method of driving the same".

Company Profile

4.8.7

Kim; Dae Sun - Hwaseong-si KR
Kim; Dae-sun - Yongin-si KR
Kim; Dae-sun - Kyungki-do KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor memory apparatus and method of driving the same Grant 10,811,079 - Park , et al. October 20, 2	2020-10-20
Semiconductor Memory Apparatus And Method Of Driving The Same App 20200111520 - Park; Chan Min ; et al.	2020-04-09
Dynamic random access memory device Grant 10,332,587 - Sung , et al.	2019-06-25
Dynamic Random Access Memory Device App 20190180812 - Sung; Ki Jong ; et al.	2019-06-13
Semiconductor device Grant 10,319,726 - Nam , et al.	2019-06-11
Semiconductor Device App 20180130806 - NAM; In Cheol ; et al.	2018-05-10
Semiconductor memory devices and memory systems including the same Grant 9,390,778 - Kim , et al. July 12, 2	2016-07-12
Memory device, memory system, and operation method thereof Grant 9,293,180 - Jeong , et al. March 22, 2	2016-03-22
Semiconductor Memory Devices And Memory Systems Including The Same App 20160064056 - KIM; SU-A ; et al.	2016-03-03
Memory core and semiconductor memory device including the same Grant 9,159,398 - Mok , et al. October 13, 2	2015-10-13
Memory Device, Memory System, And Operation Method Thereof App 20140362637 - Jeong; Eui-chul ; et al.	2014-12-11
Memory Core And Semiconductor Memory Device Including The Same App 20140198589 - MOK; Jung-Il ; et al.	2014-07-17
Semiconductor memory device and burn-in test method thereof Grant 7,646,665 - Kim , et al. January 12, 2	2010-01-12
Semiconductor memory device and burn-in test method thereof App 20080151655 - Kim; Dae-sun ; et al.	2008-06-26
Integrated circuit devices having a delay locked loop that is configurable for high-frequency operation during test and methods of operating same Grant 6,486,651 - Lee , et al. November 26, 2	2002-11-26

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