loadpatents
Patent applications and USPTO patent grants for Kim; Cheolhong.The latest application filed is for "particle measuring system".
Patent | Date |
---|---|
Particle measuring system Grant 10,877,009 - Lee , et al. December 29, 2 | 2020-12-29 |
Particle Measuring System App 20200132645 - LEE; Hongku ;   et al. | 2020-04-30 |
Nozzle box assembly Grant 10,633,991 - Kang , et al. | 2020-04-28 |
Semiconductor memory device Grant 9,935,108 - Kim , et al. April 3, 2 | 2018-04-03 |
Nozzle Box Assembly App 20170204733 - KANG; Dongwoo ;   et al. | 2017-07-20 |
Semiconductor Memory Device App 20170194326 - KIM; CHUL-HO ;   et al. | 2017-07-06 |
Methods of revising overlay correction data Grant 9,679,821 - Jung , et al. June 13, 2 | 2017-06-13 |
Methods Of Revising Overlay Correction Data App 20160351455 - Jung; Woojin ;   et al. | 2016-12-01 |
Web thickness measuring equipment and method of measuring thickness of a web Grant 9,115,979 - Jun , et al. August 25, 2 | 2015-08-25 |
Methods of forming a semiconductor device Grant 9,034,765 - Park , et al. May 19, 2 | 2015-05-19 |
Patterning Method For Forming Staircase Structure And Method For Fabricating Semiconductor Device Using The Same App 20140329379 - Kim; Chul-Ho ;   et al. | 2014-11-06 |
Methods for forming fine patterns of a semiconductor device Grant 8,785,319 - Park , et al. July 22, 2 | 2014-07-22 |
Methods Of Forming A Semiconductor Device App 20140057440 - PARK; Joonsoo ;   et al. | 2014-02-27 |
Web Thickness Measuring Equipment And Method App 20140028999 - Jun; Pilgoo ;   et al. | 2014-01-30 |
Methods for forming fine patterns of a semiconductor device Grant 8,614,148 - Park , et al. December 24, 2 | 2013-12-24 |
Methods For Forming Fine Patterns Of A Semiconductor Device App 20130260562 - PARK; Joon-Soo ;   et al. | 2013-10-03 |
Methods For Forming Fine Patterns Of A Semiconductor Device App 20130260559 - PARK; Joon-Soo ;   et al. | 2013-10-03 |
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