Patent | Date |
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Semiconductor devices Grant 10,297,308 - Kim | 2019-05-21 |
Semiconductor Devices App 20180254080 - KIM; Bo Yeun | 2018-09-06 |
Semiconductor devices relating to a refreshing operation Grant 9,990,978 - Kim June 5, 2 | 2018-06-05 |
Semiconductor Devices Relating To A Refreshing Operation App 20170270997 - KIM; Bo Yeun | 2017-09-21 |
Semiconductor Device App 20170242754 - JANG; Mun Seon ;   et al. | 2017-08-24 |
Address storage circuit and memory and memory system including the same Grant 9,734,888 - Yoon , et al. August 15, 2 | 2017-08-15 |
Semiconductor devices and semiconductor systems Grant 9,589,669 - Baek , et al. March 7, 2 | 2017-03-07 |
Semiconductor device and method of driving the same Grant 9,418,725 - Kim August 16, 2 | 2016-08-16 |
Memory and memory system including the same Grant 9,396,786 - Yoon , et al. July 19, 2 | 2016-07-19 |
Semiconductor Device And Method Of Driving The Same App 20160133311 - KIM; Bo-Yeun | 2016-05-12 |
Memory performing target refresh operation and memory system including the same Grant 9,190,137 - Kim , et al. November 17, 2 | 2015-11-17 |
Memory and memory system including the same Grant 9,190,139 - Jung , et al. November 17, 2 | 2015-11-17 |
Memory And Memory System Including The Same App 20150170728 - JUNG; Chul-Moon ;   et al. | 2015-06-18 |
Address Storage Circuit And Memory And Memory System Including The Same App 20150162071 - YOON; Seok-Cheol ;   et al. | 2015-06-11 |
Memory And Memory System Including The Same App 20150162067 - KIM; Bo-Yeun ;   et al. | 2015-06-11 |
Semiconductor device Grant 9,018,997 - Kim April 28, 2 | 2015-04-28 |
Semiconductor Device App 20150091639 - KIM; Bo-Yeun | 2015-04-02 |
Memory And Memory System Including The Same App 20150085564 - YOON; Seok-Cheol ;   et al. | 2015-03-26 |
Semiconductor device and testing method thereof Grant 8,848,469 - Kim , et al. September 30, 2 | 2014-09-30 |
Parallel test circuit and method of semiconductor memory apparatus Grant 8,824,227 - Kim , et al. September 2, 2 | 2014-09-02 |
Parallel Test Circuit And Method Of Semiconductor Memory Apparatus App 20130170305 - KIM; Bo Yeun ;   et al. | 2013-07-04 |
Semiconductor Device And Testing Method Thereof App 20130107646 - KIM; Bo-Yeun ;   et al. | 2013-05-02 |
Semiconductor memory device with pulse width determination Grant 8,149,636 - Kim April 3, 2 | 2012-04-03 |
Test mode control circuit and method for using the same in semiconductor memory device Grant 8,006,148 - Kim August 23, 2 | 2011-08-23 |
Semiconductor memory device and parallel test method of the same Grant 7,940,597 - Kim May 10, 2 | 2011-05-10 |
Test Mode Control Circuit And Method For Using The Same In Semiconductor Memory Device App 20100005350 - KIM; Bo-Yeun | 2010-01-07 |
Semiconductor Memory Device App 20090323443 - KIM; Bo-Yeun | 2009-12-31 |
Semiconductor Memory Device And Parallel Test Method Of The Same App 20090219774 - KIM; Bo-Yeun | 2009-09-03 |
Column address enable signal generation circuit for semiconductor memory device Grant 7,512,018 - Kim March 31, 2 | 2009-03-31 |
Column address enable signal generation circuit for semiconductor memory device App 20080159057 - Kim; Bo-Yeun | 2008-07-03 |