loadpatents
name:-0.0077338218688965
name:-0.0065679550170898
name:-0.00043106079101562
Kilian; Volker Patent Filings

Kilian; Volker

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kilian; Volker.The latest application filed is for "memory device and method for testing memory devices with repairable redundancy".

Company Profile
0.7.7
  • Kilian; Volker - Munchen DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Loop-back method for measuring the interface timing of semiconductor devices with the aid of signatures and/or parity methods
Grant 7,398,444 - Brox , et al. July 8, 2
2008-07-08
Memory device and method for testing memory devices with repairable redundancy
Grant 7,349,253 - Perner , et al. March 25, 2
2008-03-25
Semi-conductor component, as well as a process for the in-or output of test data
Grant 7,184,339 - Bucksch , et al. February 27, 2
2007-02-27
Circuit for setting a signal propagation time for a signal on a signal line and method for ascertaining timing parameters
Grant 7,113,015 - Hauptner , et al. September 26, 2
2006-09-26
Memory device and method for testing memory devices with repairable redundancy
App 20060198215 - Perner; Martin ;   et al.
2006-09-07
Semi-conductor component, as well as a process for the in-or output of test data
App 20060087900 - Bucksch; Thorsten ;   et al.
2006-04-27
Loop-back method for measuring the interface timing of semiconductor devices with the aid of signatures and/or parity methods
App 20060059397 - Brox; Martin ;   et al.
2006-03-16
Method for generating test signals for an integrated circuit and test logic unit
Grant 6,870,392 - Kilian , et al. March 22, 2
2005-03-22
Method and apparatus for finding a fault in a signal path on a printed circuit board
Grant 6,867,597 - Hauptner , et al. March 15, 2
2005-03-15
Method for generating test signals for an integrated circuit and test logic unit
App 20030159098 - Kilian, Volker ;   et al.
2003-08-21
Method and device for measuring a temperature in an electronic component
Grant 6,600,331 - Kilian , et al. July 29, 2
2003-07-29
Method and apparatus for finding a fault in a signal path on a printed circuit board
App 20030090273 - Hauptner, Lenart ;   et al.
2003-05-15
Circuit for setting a signal propagation time for a signal on a signal line and method for ascertaining timing parameters
App 20030086578 - Hauptner, Lenart ;   et al.
2003-05-08
Method and device for measuring a temperature in an electronic component
App 20020180472 - Kilian, Volker ;   et al.
2002-12-05

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