Kihara; Naoto

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kihara; Naoto.The latest application filed is for "cell-trapping filter".

Company Profile

1.12.13

Kihara; Naoto - Tokyo JP
KIHARA; Naoto - Chiyoda-ku JP
Kihara; Naoto - Kanagawa JP
Kihara; Naoto - Yokohama JP
Kihara; Naoto - Yokohama-shi JP
Kihara; Naoto - Funabashi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Translucent substrate, organic LED element and method of manufacturing translucent substrate Grant 10,501,369 - Mashimo , et al. Dec	2019-12-10
Cell-trapping Filter App 20180296988 - KIHARA; Naoto ; et al.	2018-10-18
Translucent Substrate, Organic Led Element And Method Of Manufacturing Translucent Substrate App 20160060162 - MASHIMO; Takahiro ; et al.	2016-03-03
Method For Producing Laminate App 20140050864 - KIHARA; Naoto ; et al.	2014-02-20
Laminate and process for its production Grant 8,586,174 - Kihara , et al. November 19, 2	2013-11-19
Laminate And Process For Producing Laminate App 20130157062 - KIHARA; Naoto ; et al.	2013-06-20
Laminate And Process For Its Production App 20130149516 - KIHARA; Naoto ; et al.	2013-06-13
Laminate and process for its production Grant 8,435,633 - Kihara , et al. May 7, 2	2013-05-07
Laminate And Process For Its Production App 20120315488 - SHIDOJI; Eiji ; et al.	2012-12-13
Laminate And Process For Its Production App 20120295116 - KIHARA; Naoto ; et al.	2012-11-22
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus Grant 7,745,784 - Nakasuji , et al. June 29, 2	2010-06-29
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus App 20090050822 - Nakasuji; Mamoru ; et al.	2009-02-26
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus Grant 7,247,848 - Nakasuji , et al. July 24, 2	2007-07-24
Charged-particle-beam mapping projection-optical systems and methods for adjusting same Grant 7,183,562 - Nishimura , et al. February 27, 2	2007-02-27
Charged-particle-beam mapping projection-optical systems and methods for adjusting same App 20060192120 - Nishimura; Hiroshi ; et al.	2006-08-31
Charged-particle-beam mapping projection-optical systems and methods for adjusting same Grant 7,064,339 - Nishimura , et al. June 20, 2	2006-06-20
Charged-particle-beam mapping projection-optical systems and methods for adjusting same App 20040251428 - Nishimura, Hiroshi ; et al.	2004-12-16
Electron microscopes exhibiting improved imaging of specimen having chargeable bodies App 20040227077 - Takagi, Toru ; et al.	2004-11-18
Charged-particle-beam mapping projection-optical systems and methods for adjusting same Grant 6,765,217 - Nishimura , et al. July 20, 2	2004-07-20
Mapping electron microscopes exhibiting improved imaging of specimen having chargeable bodies Grant 6,717,145 - Takagi , et al. April 6, 2	2004-04-06
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus App 20030207475 - Nakasuji, Mamoru ; et al.	2003-11-06
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus Grant 6,593,152 - Nakasuji , et al. July 15, 2	2003-07-15
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus App 20020142496 - Nakasuji, Mamoru ; et al.	2002-10-03
Device for holding a sheet-like sample Grant 4,448,404 - Ogawa , et al. May 15, 1	1984-05-15

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