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name:-0.0025908946990967
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Kigawa; Yoichi Patent Filings

Kigawa; Yoichi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kigawa; Yoichi.The latest application filed is for "class determination system, class determination method, and class determination program".

Company Profile
0.2.5
  • Kigawa; Yoichi - Ibaraki JP
  • Kigawa; Yoichi - Osaka JP
  • KIGAWA; Yoichi - Ibaraki-shi Osaka
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Image classification system and method, classification data creation system and method, and storage medium
Grant 11,410,409 - Kigawa August 9, 2
2022-08-09
Class Determination System, Class Determination Method, And Class Determination Program
App 20220237895 - Chan; Yatfei ;   et al.
2022-07-28
Inspection System, Inspection Method, And Inspection Program
App 20220236192 - Kigawa; Yoichi ;   et al.
2022-07-28
Brdc Sign Detecting System
App 20220053737 - KOZONOI; Nobuyuki ;   et al.
2022-02-24
Inspection apparatus and inspection method
Grant 10,891,725 - Kigawa January 12, 2
2021-01-12
Image Classification System And Method, Classification Data Creation System And Method, And Storage Medium
App 20180341829 - Kigawa; Yoichi
2018-11-29
Inspection Apparatus And Inspection Method
App 20180144461 - Kigawa; Yoichi
2018-05-24

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