Kiesewetter; Joerg

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kiesewetter; Joerg.The latest application filed is for "method for testing a test substrate under defined thermal conditions and thermally conditionable prober".

Company Profile

0.9.9

Kiesewetter; Joerg - Thiendorf OT Sacka DE
Kiesewetter; Joerg - Sacka N/A DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for testing a test substrate under defined thermal conditions and thermally conditionable prober Grant 9,395,411 - Kiesewetter , et al. July 19, 2	2016-07-19
Method For Testing A Test Substrate Under Defined Thermal Conditions And Thermally Conditionable Prober App 20140028337 - Kiesewetter; Joerg ; et al.	2014-01-30
Method for testing a test substrate under defined thermal conditions and thermally conditionable prober Grant 8,497,693 - Kiesewetter , et al. July 30, 2	2013-07-30
Probe holder Grant 8,402,848 - Kiesewetter , et al. March 26, 2	2013-03-26
Arrangement and method for focusing a multiplane image acquisition on a prober Grant 8,072,586 - Teich , et al. December 6, 2	2011-12-06
Arrangement And Method For Focusing A Multiplane Image Acquisition On A Prober App 20110013011 - Teich; Michael ; et al.	2011-01-20
Probe Holder App 20100294053 - Kiesewetter; Joerg ; et al.	2010-11-25
Method For Testing A Test Substrate Under Defined Thermal Conditions And Thermally Conditionable Prober App 20100289511 - Kiesewetter; Joerg ; et al.	2010-11-18
Apparatus And Method For Assembling Several Semiconductor Devices Onto A Target Substrate App 20100011569 - DIETRICH; Claus ; et al.	2010-01-21
Arrangement And Method For Focusing A Multiplane Image Acquisition On A Prober App 20080212078 - Teich; Michael ; et al.	2008-09-04
Device for testing thin elements Grant 7,282,930 - Beier , et al. October 16, 2	2007-10-16
Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station Grant 7,265,536 - Kiesewetter , et al. September 4, 2	2007-09-04
Probe station comprising a bellows with EMI shielding capabilities Grant 7,235,990 - Kreissig , et al. June 26, 2	2007-06-26
Device for testing thin elements App 20070139067 - Beier; Uwe ; et al.	2007-06-21
Probe Station Comprising A Bellows With Emi Shielding Capabilities App 20070132465 - Kreissig; Stefan ; et al.	2007-06-14
Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station App 20060212248 - Kiesewetter; Joerg ; et al.	2006-09-21

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