Kida; Atsushi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kida; Atsushi.The latest application filed is for "image processing method, image processing apparatus and non-transitory computer readable medium".

Company Profile

0.17.4

Kida; Atsushi - Shizuoka JP
Kida; Atsushi - Tokyo JP
Kida; Atsushi - Saitama JP
Kida; Atsushi - Saitama-Ken JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Image Processing Method, Image Processing Apparatus And Non-transitory Computer Readable Medium App 20210334527 - Kida; Atsushi	2021-10-28
Image Processing Method, Image Processing Apparatus And Non-transitory Computer Readable Medium App 20210337110 - Kida; Atsushi	2021-10-28
Information processing method and information processing apparatus Grant 11,120,533 - Kida September 14, 2	2021-09-14
Information Processing Method And Information Processing Apparatus App 20200020086 - Kida; Atsushi	2020-01-16
Optical member inspecting apparatus and method of inspection thereof Grant 6,804,386 - Nakayama , et al. October 12, 2	2004-10-12
Optical member inspecting apparatus and method of inspection thereof Grant 6,788,804 - Nakayama , et al. September 7, 2	2004-09-07
Target for photogrammetric analytical measurement system Grant 6,717,683 - Wakashiro , et al. April 6, 2	2004-04-06
Optical member inspecting apparatus and method of inspection thereof Grant 6,697,513 - Nakayama , et al. February 24, 2	2004-02-24
Optical member inspecting apparatus and method of inspection thereof Grant 6,636,625 - Nakayama , et al. October 21, 2	2003-10-21
Device for calculating positional data of standard points of photogrammetric target Grant 6,628,803 - Wakashiro , et al. September 30, 2	2003-09-30
Camera for use in photogrammetric analytical measurement Grant 6,600,511 - Kaneko , et al. July 29, 2	2003-07-29
Optical member inspecting apparatus and method of inspection thereof Grant 6,476,909 - Nakayama , et al. November 5, 2	2002-11-05
Optical Member Inspecting Apparatus And Method Of Inspection Thereof App 20020057428 - Nakayama, Toshihiro ; et al.	2002-05-16
Standard measurement scale and markers for defining standard measurement scale Grant 6,339,683 - Nakayama , et al. January 15, 2	2002-01-15
Photogrammetric analytical measurement system Grant 6,304,669 - Kaneko , et al. October 16, 2	2001-10-16
Optical member inspecting apparatus and method of inspection thereof Grant 6,148,097 - Nakayama , et al. November 14, 2	2000-11-14
Photogrammetric analytical measurement system Grant 6,144,761 - Kaneko , et al. November 7, 2	2000-11-07
Standard measurement scale and markers for defining standard measurement scale Grant 6,108,497 - Nakayama , et al. August 22, 2	2000-08-22
Optical element inspecting apparatus Grant 5,847,822 - Sugiura , et al. December 8, 1	1998-12-08
Optical member inspecting apparatus Grant 5,835,207 - Sugiura , et al. November 10, 1	1998-11-10
Optical element inspecting apparatus Grant 5,828,500 - Kida , et al. October 27, 1	1998-10-27

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