Khristo; Sergey

Patent Applications and Registrations

Patent applications and USPTO patent grants for Khristo; Sergey.The latest application filed is for "measuring height difference in patterns on semiconductor wafers".

Company Profile

4.5.5

Khristo; Sergey - Ashdod IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Measuring height difference in patterns on semiconductor wafers Grant 11,301,983 - Schwarzband , et al. April 12, 2	2022-04-12
Measuring Height Difference In Patterns On Semiconductor Wafers App 20200380668 - Schwarzband; Ishai ; et al.	2020-12-03
Measuring height difference in patterns on semiconductor wafers Grant 10,748,272 - Schwarzband , et al. A	2020-08-18
Technique for inspecting semiconductor wafers Grant 10,636,140 - Schwarzband , et al.	2020-04-28
Technique For Inspecting Semiconductor Wafers App 20180336671 - SCHWARZBAND; Ishai ; et al.	2018-11-22
Measuring Height Difference In Patterns On Semiconductor Wafers App 20180336675 - SCHWARZBAND; Ishai ; et al.	2018-11-22
System and method for printability based inspection Grant 9,927,375 - Attal , et al. March 27, 2	2018-03-27
System And Method For Printability Based Inspection App 20170176347 - Attal; Shay ; et al.	2017-06-22
System and method for evaluating error sources associated with a mask Grant 8,327,298 - Faivishevsky , et al. December 4, 2	2012-12-04
System And Method For Evaluating Error Sources Associated With A Mask App 20100235805 - Faivishevsky; Lev ; et al.	2010-09-16

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