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name:-0.0071609020233154
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Kharkivskiy; Sergiy Patent Filings

Kharkivskiy; Sergiy

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kharkivskiy; Sergiy.The latest application filed is for "high frequency analysis of a device under test".

Company Profile
1.6.6
  • Kharkivskiy; Sergiy - Penrith N/A AU
  • Kharkivskiy; Sergiy - Rolla MO
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
High frequency analysis of a device under test
Grant 9,081,045 - Zoughi , et al. July 14, 2
2015-07-14
High Frequency Analysis Of A Device Under Test
App 20120235696 - Zoughi; Reza ;   et al.
2012-09-20
High frequency analysis of a device under test
Grant 8,212,573 - AbouKhousa , et al. July 3, 2
2012-07-03
Microwave And Millimeter Wave Resonant Sensor Having Perpendicular Feed, And Imaging System
App 20100328142 - Zoughi; Reza ;   et al.
2010-12-30
High Frequency Analysis Of A Device Under Test
App 20100176789 - Zoughi; Reza ;   et al.
2010-07-15
Microwave and millimeter wave imaging system
Grant 7,746,266 - Zoughi , et al. June 29, 2
2010-06-29
Microwave And Millimeter Wave Imaging System
App 20090237092 - Zoughi; Reza ;   et al.
2009-09-24
Non-destructive testing of physical characteristics of composite structures
Grant 7,439,749 - Zoughi , et al. October 21, 2
2008-10-21
Non-destructive Testing Of Physical Characteristics Of Composite Structures
App 20080129316 - Zoughi; Reza ;   et al.
2008-06-05
Method and apparatus for nondestructive sample inspection
Grant 7,190,177 - Zoughi , et al. March 13, 2
2007-03-13
Method and apparatus for nondestructive sample inspection
App 20060039257 - Zoughi; Reza ;   et al.
2006-02-23

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