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Patent applications and USPTO patent grants for Kharkivskiy; Sergiy.The latest application filed is for "high frequency analysis of a device under test".
Patent | Date |
---|---|
High frequency analysis of a device under test Grant 9,081,045 - Zoughi , et al. July 14, 2 | 2015-07-14 |
High Frequency Analysis Of A Device Under Test App 20120235696 - Zoughi; Reza ;   et al. | 2012-09-20 |
High frequency analysis of a device under test Grant 8,212,573 - AbouKhousa , et al. July 3, 2 | 2012-07-03 |
Microwave And Millimeter Wave Resonant Sensor Having Perpendicular Feed, And Imaging System App 20100328142 - Zoughi; Reza ;   et al. | 2010-12-30 |
High Frequency Analysis Of A Device Under Test App 20100176789 - Zoughi; Reza ;   et al. | 2010-07-15 |
Microwave and millimeter wave imaging system Grant 7,746,266 - Zoughi , et al. June 29, 2 | 2010-06-29 |
Microwave And Millimeter Wave Imaging System App 20090237092 - Zoughi; Reza ;   et al. | 2009-09-24 |
Non-destructive testing of physical characteristics of composite structures Grant 7,439,749 - Zoughi , et al. October 21, 2 | 2008-10-21 |
Non-destructive Testing Of Physical Characteristics Of Composite Structures App 20080129316 - Zoughi; Reza ;   et al. | 2008-06-05 |
Method and apparatus for nondestructive sample inspection Grant 7,190,177 - Zoughi , et al. March 13, 2 | 2007-03-13 |
Method and apparatus for nondestructive sample inspection App 20060039257 - Zoughi; Reza ;   et al. | 2006-02-23 |
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