Kenny; Oisin
Patent Applications and Registrations
Patent applications and USPTO patent grants for Kenny; Oisin.The latest application filed is for "reducing line edge roughness in hardmask integration schemes".
- Kenny; Oisin - Dresden DE
| Patent | Date |
|---|---|
| Reducing Line Edge Roughness In Hardmask Integration Schemes App 20130302989 - Kenny; Oisin ; et al. | 2013-11-14 |
| Replacement Gate Electrode Fill At Reduced Temperatures App 20130302974 - Hahn; Jens ; et al. | 2013-11-14 |
| Reducing Defects In Electronic Apparatus App 20130134126 - Kowal-Paul; Dorota ; et al. | 2013-05-30 |
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