Kenbou; Yukio
Patent Applications and Registrations
Patent applications and USPTO patent grants for Kenbou; Yukio.The latest application filed is for "surface inspection apparatus and method thereof".
- Kenbou; Yukio - Tokyo JP
- Kenbou; Yukio - Ibaraki JP
- Kenbou; Yukio - Tsuchiura JP
| Patent | Date |
|---|---|
| Surface inspection apparatus and method thereof Grant 9,551,670 - Ishimaru , et al. January 24, 2 | 2017-01-24 |
| Surface Inspection Apparatus And Method Thereof App 20140218723 - ISHIMARU; Ichiro ; et al. | 2014-08-07 |
| Surface inspection apparatus and method thereof Grant 8,729,514 - Ishimaru , et al. May 20, 2 | 2014-05-20 |
| Surface Inspection Apparatus And Method Thereof App 20120069329 - ISHIMARU; Ichiro ; et al. | 2012-03-22 |
| Surface inspection apparatus and method thereof Grant 7,952,085 - Ishimaru , et al. May 31, 2 | 2011-05-31 |
| Surface Inspection Apparatus And Method Thereof App 20090103078 - ISHIMARU; Ichiro ; et al. | 2009-04-23 |
| Method of Control of Probe Scan and Apparatus for Controlling Probe Scan of Scanning Probe Microscope App 20080236259 - Kurenuma; Tooru ; et al. | 2008-10-02 |
| Surface inspection apparatus and method thereof Grant 7,417,244 - Ishimaru , et al. August 26, 2 | 2008-08-26 |
| Probe manufacturing method, probe, and scanning probe microscope Grant 7,388,199 - Morimoto , et al. June 17, 2 | 2008-06-17 |
| Scanning type probe microscope and probe moving control method therefor Grant 7,350,404 - Kurenuma , et al. April 1, 2 | 2008-04-01 |
| Scanning probe microscope and measurement method using the same Grant 7,333,191 - Murayama , et al. February 19, 2 | 2008-02-19 |
| Surface inspection apparatus and method thereof Grant 7,242,016 - Ishimaru , et al. July 10, 2 | 2007-07-10 |
| Surface inspection apparatus and method thereof App 20070121108 - Ishimaru; Ichiro ; et al. | 2007-05-31 |
| Scanning type probe microscope and probe moving control method therefor App 20060284083 - Kurenuma; Tooru ; et al. | 2006-12-21 |
| Probe manufacturing method, probe, and scanning probe microsope App 20060284084 - Morimoto; Takafumi ; et al. | 2006-12-21 |
| Surface inspection apparatus and method thereof App 20050185172 - Ishimaru, Ichiro ; et al. | 2005-08-25 |
| Surface inspection apparatus and method thereof Grant 6,894,302 - Ishimaru , et al. May 17, 2 | 2005-05-17 |
| Scanning probe microscope and measurement method using the same App 20050012936 - Murayama, Ken ; et al. | 2005-01-20 |
| Surface inspection apparatus and method thereof App 20010030296 - Ishimaru, Ichiro ; et al. | 2001-10-18 |
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