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Identifying parasitic diode(s) in an integrated circuit physical design Grant 8,756,554 - Kemerer , et al. June 17, 2 | 2014-06-17 |
Identifying Parasitic Diode(s) In An Integrated Circuit Physical Design App 20130067425 - Kemerer; Douglas W. ;   et al. | 2013-03-14 |
Identifying parasitic diode(s) in an integrated circuit physical design Grant 8,191,030 - Kemerer , et al. May 29, 2 | 2012-05-29 |
Intersect area based ground rule for semiconductor design Grant 7,941,780 - Avanessian , et al. May 10, 2 | 2011-05-10 |
Mechanism for detection and compensation of NBTI induced threshold degradation Grant 7,849,426 - Goodnow , et al. December 7, 2 | 2010-12-07 |
Methods and circuits to reduce threshold voltage tolerance and skew in multi-threshold voltage applications Grant 7,696,811 - Barrows , et al. April 13, 2 | 2010-04-13 |
Methods to reduce threshold voltage tolerance and skew in multi-threshold voltage applications Grant 7,671,666 - Barrows , et al. March 2, 2 | 2010-03-02 |
Programmable on-chip sense line Grant 7,619,398 - Barrows , et al. November 17, 2 | 2009-11-17 |
Intersect Area Based Ground Rule For Semiconductor Design App 20090265673 - Avanessian; Albrik ;   et al. | 2009-10-22 |
Identifying Parasitic Diode(s) In An Integrated Circuit Physical Design App 20090150842 - Kemerer; Douglas W. ;   et al. | 2009-06-11 |
Mechanism For Detection And Compensation Of Nbti Induced Threshold Degradation App 20090113358 - Goodnow; Kenneth J. ;   et al. | 2009-04-30 |
Mechanism for detection and compensation of NBTI induced threshold degradation Grant 7,504,847 - Goodnow , et al. March 17, 2 | 2009-03-17 |
Identifying parasitic diode(s) in an integrated circuit physical design Grant 7,490,303 - Kemerer , et al. February 10, 2 | 2009-02-10 |
Circuits to reduce threshold voltage tolerance and skew in multi-threshold voltage applications Grant 7,459,958 - Barrows , et al. December 2, 2 | 2008-12-02 |
Methods To Reduce Threshold Voltage Tolerance And Skew In Multi-threshold Voltage Applications App 20080265983 - Barrows; Corey Kenneth ;   et al. | 2008-10-30 |
Methods And Circuits To Reduce Threshold Voltage Tolerance And Skew In Multi-threshold Voltage Applications App 20080246533 - Barrows; Corey Kenneth ;   et al. | 2008-10-09 |
Programmable On-chip Sense Line App 20080211472 - Barrows; Corey K. ;   et al. | 2008-09-04 |
Programmable on-chip sense line Grant 7,397,228 - Barrows , et al. July 8, 2 | 2008-07-08 |
Methods And Circuits To Reduce Threshold Voltage Tolerance and Skew In Multi-Threshold Voltage Applications App 20080122524 - Barrows; Corey Kenneth ;   et al. | 2008-05-29 |
Mechanism For Detection And Compensation Of NBTI Induced Threshold Degradation App 20080094092 - Goodnow; Kenneth J ;   et al. | 2008-04-24 |
Methods And Circuits To Reduce Threshold Voltage Tolerance And Skew In Multi-threshold Voltage Applications App 20080086706 - Barrows; Corey Kenneth ;   et al. | 2008-04-10 |
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Programmable On-chip Sense Line App 20070162770 - Barrows; Corey K. ;   et al. | 2007-07-12 |
Integrated circuit chip having a ringed wiring layer interposed between a contact layer and a wiring grid Grant 7,146,596 - Bednar , et al. December 5, 2 | 2006-12-05 |
Method and system for improving integrated circuit manufacturing productivity Grant 7,076,749 - Kemerer , et al. July 11, 2 | 2006-07-11 |
Method And System For Improving Integrated Circuit Manufacturing Productivity App 20050278663 - Kemerer, Douglas W. ;   et al. | 2005-12-15 |
Integrated Circuit Chip Having A Ringed Wiring Layer Interposed Between A Contact Layer And A Wiring Grid App 20050050505 - Bednar, Thomas R. ;   et al. | 2005-03-03 |
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