loadpatents
name:-0.0073530673980713
name:-0.010845899581909
name:-0.00052285194396973
Keim; Martin Patent Filings

Keim; Martin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Keim; Martin.The latest application filed is for "reconfigurable scan network defect diagnosis".

Company Profile
0.9.6
  • Keim; Martin - Sherwood OR
  • Keim; Martin - Olching DE
  • Keim; Martin - Mohrendorf DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Reconfigurable scan network defect diagnosis
Grant 10,520,550 - Danialy , et al. Dec
2019-12-31
Reconfigurable Scan Network Defect Diagnosis
App 20180335475 - Danialy; Givargis Avareh ;   et al.
2018-11-22
Test access architecture for stacked memory and logic dies
Grant 9,689,918 - Cheng , et al. June 27, 2
2017-06-27
Test access architecture for multi-die circuits
Grant 9,389,944 - Press , et al. July 12, 2
2016-07-12
Test access architecture for stacked dies
Grant 9,389,945 - Press , et al. July 12, 2
2016-07-12
Fault dictionaries for integrated circuit yield and quality analysis methods and systems
Grant 7,987,442 - Rajski , et al. July 26, 2
2011-07-26
Determining And Analyzing Integrated Circuit Yield And Quality
App 20090210183 - Rajski; Janusz ;   et al.
2009-08-20
Determining and analyzing integrated circuit yield and quality
Grant 7,512,508 - Rajski , et al. March 31, 2
2009-03-31
Device for and method of examining the signal performance of semiconductor circuits
Grant 7,178,071 - Keim , et al. February 13, 2
2007-02-13
Fault dictionaries for integrated circuit yield and quality analysis methods and systems
App 20060066338 - Rajski; Janusz ;   et al.
2006-03-30
Determining and analyzing integrated circuit yield and quality
App 20060066339 - Rajski; Janusz ;   et al.
2006-03-30
Integrated circuit yield and quality analysis methods and systems
App 20060053357 - Rajski; Janusz ;   et al.
2006-03-09
Device for and method of examining the signal performance of semiconductor circuits
App 20030030071 - Keim, Martin ;   et al.
2003-02-13
Method and apparatus for monitoring a selected group of fuel cells of a high-temperature fuel cell stack
Grant 6,432,569 - Zeilinger , et al. August 13, 2
2002-08-13
Process for operation of a PEM fuel cell unit
Grant 6,110,611 - Stuhler , et al. August 29, 2
2000-08-29

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