Kea; Marc Jurian

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kea; Marc Jurian.The latest application filed is for "a method for characterizing a manufacturing process of semiconductor devices".

Company Profile

6.7.9

Kea; Marc Jurian - Morgan Hill CA
Kea; Marc Jurian - Moran Hill CA
Kea; Marc Jurian - Veldhoven NL
Kea; Marc Jurian - Den Dungen NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Defect prediction Grant 11,403,453 - Cheong , et al. August 2, 2	2022-08-02
Method of determining a position of a feature Grant 11,392,044 - Huijgen , et al. July 19, 2	2022-07-19
A Method For Characterizing A Manufacturing Process Of Semiconductor Devices App 20220100098 - TEL; Wim Tjibbo ; et al.	2022-03-31
Control based on probability density function of parameter Grant 11,143,971 - Tel , et al. October 12, 2	2021-10-12
Defect Prediction App 20210150115 - CHEONG; Lin Lee ; et al.	2021-05-20
Control Based On Probability Density Function Of Parameter App 20210080838 - TEL; Wim Tjibbo ; et al.	2021-03-18
Method Of Determining A Position Of A Feature App 20200150547 - HUIJGEN; Ralph Timotheus ; et al.	2020-05-14
Method of determining a position of a feature Grant 10,578,980 - Huijgen , et al.	2020-03-03
Method Of Determining A Position Of A Feature App 20190339211 - HUIJGEN; Ralph Timotheus ; et al.	2019-11-07
Inspection methods, substrates having metrology targets, lithographic system and device manufacturing method Grant 9,958,790 - Nooitgedagt , et al. May 1, 2	2018-05-01
Method of calibrating a lithographic apparatus, device manufacturing method and associated data processing apparatus and computer program product Grant 9,715,181 - Schmitt-Weaver , et al. July 25, 2	2017-07-25
Method of operating a lithographic apparatus, device manufacturing method and associated data processing apparatus and computer program product Grant 9,507,279 - Schmitt-Weaver , et al. November 29, 2	2016-11-29
Inspection Methods, Substrates Having Metrology Targets, Lithographic System and Device Manufacturing Method App 20160327871 - NOOITGEDAGT; Tjitte ; et al.	2016-11-10
Method of Operating a Lithographic Apparatus, Device Manufacturing Method and Associated Data Processing Apparatus and Computer Program Product App 20140168627 - SCHMITT-WEAVER; Emil Peter ; et al.	2014-06-19
Method Of Calibrating A Lithographic Apparatus, Device Manufacturing Method And Associated Data Processing Apparatus And Computer Program Product App 20140168620 - SCHMITT-WEAVER; Emil Peter ; et al.	2014-06-19

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