loadpatents
name:-0.038919925689697
name:-0.02626895904541
name:-0.00043487548828125
Ke; Chung-Hu Patent Filings

Ke; Chung-Hu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ke; Chung-Hu.The latest application filed is for "cmos devices with schottky source and drain regions".

Company Profile
0.29.35
  • Ke; Chung-Hu - Taipei TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
CMOS devices with Schottky source and drain regions
Grant 9,673,105 - Ko , et al. June 6, 2
2017-06-06
CMOS Devices with Schottky Source and Drain Regions
App 20140094008 - Ko; Chih-Hsin ;   et al.
2014-04-03
MOS devices having elevated source/drain regions
Grant 8,569,837 - Ko , et al. October 29, 2
2013-10-29
CMOS devices with Schottky source and drain regions
Grant 8,426,298 - Ko , et al. April 23, 2
2013-04-23
Semiconductor device and a method of fabricating the device
Grant 8,154,107 - Ke , et al. April 10, 2
2012-04-10
Isolation spacer for thin SOI devices
Grant 8,084,305 - Ko , et al. December 27, 2
2011-12-27
Dual metal silicides for lowering contact resistance
Grant 8,039,284 - Ke , et al. October 18, 2
2011-10-18
Contact barrier structure and manufacturing methods
Grant 8,030,210 - Wang , et al. October 4, 2
2011-10-04
CMOS Devices with Schottky Source and Drain Regions
App 20110223727 - Ko; Chih-Hsin ;   et al.
2011-09-15
Metal stress memorization technology
Grant 7,985,652 - Ke , et al. July 26, 2
2011-07-26
Semiconductor structure having selective silicide-induced stress and a method of producing same
Grant 7,875,959 - Ke , et al. January 25, 2
2011-01-25
BiCMOS performance enhancement by mechanical uniaxial strain and methods of manufacture
Grant 7,803,718 - Ko , et al. September 28, 2
2010-09-28
Contact Barrier Structure and Manufacturing Methods
App 20100167485 - Wang; Ching-Ya ;   et al.
2010-07-01
Shallow trench isolation structure for semiconductor device
Grant 7,745,904 - Ko , et al. June 29, 2
2010-06-29
Hybrid Schottky source-drain CMOS for high mobility and low barrier
Grant 7,737,532 - Ke , et al. June 15, 2
2010-06-15
Contact barrier structure and manufacturing methods
Grant 7,709,903 - Wang , et al. May 4, 2
2010-05-04
Isolation spacer for thin SOI devices
Grant 7,582,934 - Ko , et al. September 1, 2
2009-09-01
Transistors with stressed channels
Grant 7,569,896 - Ko , et al. August 4, 2
2009-08-04
System and method for forming a semiconductor device source/drain contact
Grant 7,538,398 - Ke , et al. May 26, 2
2009-05-26
BiCMOS Performance Enhancement by Mechanical Uniaxial Strain and Methods of Manufacture
App 20090117695 - Ko; Chih-Hsin ;   et al.
2009-05-07
MOS transistors with selectively strained channels
Grant 7,511,348 - Ko , et al. March 31, 2
2009-03-31
Metal Stress Memorization Technology
App 20090075442 - Ke; Chung-Hu ;   et al.
2009-03-19
System and Method for Forming a Semiconductor Device Source/Drain Contact
App 20080315321 - Ke; Chung-Hu ;   et al.
2008-12-25
BiCMOS performance enhancement by mechanical uniaxial strain and methods of manufacture
Grant 7,466,008 - Ko , et al. December 16, 2
2008-12-16
Transistor mobility improvement by adjusting stress in shallow trench isolation
Grant 7,465,620 - Ko , et al. December 16, 2
2008-12-16
Contact barrier structure and manufacturing methods
App 20080290421 - Wang; Ching-Ya ;   et al.
2008-11-27
MOS devices having elevated source/drain regions
App 20080277735 - Ko; Chih-Hsin ;   et al.
2008-11-13
BiCMOS performance enhancement by mechanical uniaxial strain and methods of manufacture
App 20080224227 - Ko; Chih-Hsin ;   et al.
2008-09-18
MOS transistors with selectively strained channels
App 20080224225 - Ko; Chih-Hsin ;   et al.
2008-09-18
CMOS devices with schottky source and drain regions
App 20080191285 - Ko; Chih-Hsin ;   et al.
2008-08-14
Semiconductor device and a method of fabricating the device
App 20080185659 - Ke; Chung-Hu ;   et al.
2008-08-07
High performance semiconductor devices fabricated with strain-induced processes and methods for making same
Grant 7,394,136 - Ke , et al. July 1, 2
2008-07-01
Isolation Spacer For Thin Soi Devices
App 20080142888 - KO; Chih-Hsin ;   et al.
2008-06-19
Isolation Spacer For Thin Soi Devices
App 20080145982 - KO; Chih-Hsin ;   et al.
2008-06-19
Dual metal silicides for lowering contact resistance
App 20080145984 - Ke; Chung-Hu ;   et al.
2008-06-19
Isolation spacer for thin SOI devices
Grant 7,358,571 - Ko , et al. April 15, 2
2008-04-15
Diffusion topography engineering for high performance CMOS fabrication
Grant 7,355,262 - Ko , et al. April 8, 2
2008-04-08
Transistors with stressed channels and methods of manufacture
App 20070267694 - Ko; Chih-Hsin ;   et al.
2007-11-22
Shallow trench isolation structure for semiconductor device
App 20070235835 - Ko; Chih-Hsin ;   et al.
2007-10-11
Diffusion topography engineering for high performance CMOS fabrication
App 20070215936 - Ko; Chih-Hsin ;   et al.
2007-09-20
Method of forming a shallow trench isolation structure
Grant 7,238,564 - Ko , et al. July 3, 2
2007-07-03
Transistor mobility improvement by adjusting stress in shallow trench isolation
App 20070132035 - Ko; Chih-Hsin ;   et al.
2007-06-14
Transistor mobility improvement by adjusting stress in shallow trench isolation
Grant 7,190,036 - Ko , et al. March 13, 2
2007-03-13
Hybrid Schottky source-drain CMOS for high mobility and low barrier
App 20070052027 - Ke; Chung-Hu ;   et al.
2007-03-08
Semiconductor structure having selective silicide-induced stress and a method of producing same
App 20070045849 - Ke; Chung-Hu ;   et al.
2007-03-01
High performance CMOS with metal-gate and Schottky source/drain
Grant 7,176,537 - Lee , et al. February 13, 2
2007-02-13
High performance CMOS with metal-gate and Schottky source/drain
App 20060273409 - Lee; Wen-Chin ;   et al.
2006-12-07
Semiconductor structure having a strained region and a method of fabricating same
App 20060208336 - Lee; Wen-Chin ;   et al.
2006-09-21
Method of forming a shallow trench isolation structure
App 20060205164 - Ko; Chih-Hsin ;   et al.
2006-09-14
Thermal anneal process for strained-Si devices
Grant 7,098,119 - Ke , et al. August 29, 2
2006-08-29
Capacitor-less 1T-DRAM cell with Schottky source and drain
App 20060125121 - Ko; Chih-Hsin ;   et al.
2006-06-15
Transistor mobility by adjusting stress in shallow trench isolation
App 20060121688 - Ko; Chih-Hsin ;   et al.
2006-06-08
Self-aligned gated p-i-n diode for ultra-fast switching
App 20060091490 - Chen; Hung-Wei ;   et al.
2006-05-04
Isolation spacer for thin SOI devices
App 20060081928 - Ko; Chih-Hsin ;   et al.
2006-04-20
High performance semiconductor devices fabricated with strain-induced processes and methods for making same
App 20050263828 - Ke, Chung-Hu ;   et al.
2005-12-01
Thermal anneal process for strained-Si devices
App 20050253166 - Ke, Chung-Hu ;   et al.
2005-11-17
Strained channel on insulator device
App 20050233552 - Ke, Chung-Hu ;   et al.
2005-10-20
Isolation structure with nitrogen-containing liner and methods of manufacture
App 20050224907 - Ko, Chih-Hsin ;   et al.
2005-10-13
High performance semiconductor devices fabricated with strain-induced processes and methods for making same
Grant 6,949,443 - Ke , et al. September 27, 2
2005-09-27
Strained silicon structure
App 20050194658 - Ke, Chung-Hu ;   et al.
2005-09-08
Heterostructure resistor and method of forming the same
App 20050127400 - Yeo, Yee-Chia ;   et al.
2005-06-16
High performance semiconductor devices fabricated with strain-induced processes and methods for making same
App 20050079677 - Ke, Chung-Hu ;   et al.
2005-04-14

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed