Kawoosa; Mudasir Shafat

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kawoosa; Mudasir Shafat.The latest application filed is for "scan test control decoder with storage elements for use within integrated circuit (ic) devices having limited test interface".

Company Profile

6.13.10

Kawoosa; Mudasir Shafat - Srinagar IN
Kawoosa; Mudasir Shafat - Karnataka IN
Kawoosa; Mudasir Shafat - Bangalore IN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Generating multiple pseudo static control signals using on-chip JTAG state machine Grant 11,408,936 - Kawoosa , et al. August 9, 2	2022-08-09
Scan test control decoder with storage elements for use within integrated circuit (IC) devices having limited test interface Grant 11,402,432 - Kawoosa , et al. August 2, 2	2022-08-02
Scan Test Control Decoder With Storage Elements For Use Within Integrated Circuit (ic) Devices Having Limited Test Interface App 20210041497 - KAWOOSA; Mudasir Shafat ; et al.	2021-02-11
Non-interleaved scan operation for achieving higher scan throughput in presence of slower scan outputs Grant 10,877,093 - Kawoosa , et al. December 29, 2	2020-12-29
Scan test control decoder with storage elements for use within integrated circuit (IC) devices having limited test interface Grant 10,852,353 - Kawoosa , et al. December 1, 2	2020-12-01
Generating Multiple Pseudo Static Control Signals Using On-chip Jtag State Machine App 20200333397 - Kawoosa; Mudasir Shafat ; et al.	2020-10-22
Dynamically protective scan data control Grant 10,746,797 - Parekhji , et al. A	2020-08-18
Generating multiple pseudo static control signals using on-chip JTAG state machine Grant 10,739,402 - Kawoosa , et al. A	2020-08-11
Non-interleaved Scan Operation For Achieving Higher Scan Throughput In Presence Of Slower Scan Outputs App 20180372798 - Kawoosa; Mudasir Shafat ; et al.	2018-12-27
Generating Multiple Pseudo Static Control Signals Using On-chip Jtag State Machine App 20180321311 - Kawoosa; Mudasir Shafat ; et al.	2018-11-08
Non-interleaved scan operation for achieving higher scan throughput in presence of slower scan outputs Grant 10,088,525 - Kawoosa , et al. October 2, 2	2018-10-02
Generating multiple pseudo static control signals using on-chip JTAG state machine Grant 10,060,979 - Kawoosa , et al. August 28, 2	2018-08-28
Method and apparatus for test time reduction using fractional data packing Grant 9,970,987 - Potty , et al. May 15, 2	2018-05-15
Generating Multiple Pseudo Static Control Signals Using On-chip JTAG State Machine App 20180038910 - Kawoosa; Mudasir Shafat ; et al.	2018-02-08
Increase data transfer throughput by enabling dynamic JTAG test mode entry and sharing of all JTAG pins Grant 9,772,376 - Kawoosa , et al. September 26, 2	2017-09-26
Non-Interleaved Scan Operation for Achieving Higher Scan Throughput in Presence of Slower Scan Outputs App 20170234925 - Kawoosa; Mudasir Shafat ; et al.	2017-08-17
Method and Apparatus for Test Time Reduction Using Fractional Data Packing App 20160356849 - Potty; Sreenath Narayanan ; et al.	2016-12-08
Method and apparatus for test time reduction using fractional data packing Grant 9,448,284 - Potty , et al. September 20, 2	2016-09-20
Scan throughput enhancement in scan testing of a device-under-test Grant 9,347,991 - Kawoosa , et al. May 24, 2	2016-05-24
Scan Throughput Enhancement In Scan Testing Of A Device-under-test App 20160131704 - Kawoosa; Mudasir Shafat ; et al.	2016-05-12
Handling slower scan outputs at optimal frequency Grant 9,261,560 - Mittal , et al. February 16, 2	2016-02-16
Method And Apparatus For Test Time Reduction Using Fractional Data Packing App 20150323596 - Potty; Sreenath Narayanan ; et al.	2015-11-12
Handling Slower Scan Outputs At Optimal Frequency App 20150185283 - Mittal; Rajesh Kumar ; et al.	2015-07-02

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