Kawayama; Iwao
Patent Applications and Registrations
Patent applications and USPTO patent grants for Kawayama; Iwao.The latest application filed is for "modification processing device, modification monitoring device and modification processing method".
- Kawayama; Iwao - Suita JP
- Kawayama; Iwao - Osaka JP
- KAWAYAMA; Iwao - Suita-shi JP
| Patent | Date |
|---|---|
| Inspection apparatus and inspection method Grant 10,158,325 - Nakanishi , et al. Dec | 2018-12-18 |
| Modification processing device, modification monitoring device and modification processing method Grant 10,001,441 - Nakanishi , et al. June 19, 2 | 2018-06-19 |
| Photo device inspection apparatus and photo device inspection method Grant 9,651,607 - Nakanishi , et al. May 16, 2 | 2017-05-16 |
| Inspecting device and inspecting method Grant 9,541,508 - Nakanishi , et al. January 10, 2 | 2017-01-10 |
| Inspection apparatus and inspection method Grant 9,450,536 - Nakanishi , et al. September 20, 2 | 2016-09-20 |
| Inspection apparatus and inspection method Grant 9,404,874 - Nakanishi , et al. August 2, 2 | 2016-08-02 |
| Inspection apparatus and inspection method Grant 9,383,321 - Nakanishi , et al. July 5, 2 | 2016-07-05 |
| Modification Processing Device, Modification Monitoring Device And Modification Processing Method App 20160093539 - NAKANISHI; Hidetoshi ; et al. | 2016-03-31 |
| Inspecting device and inspecting method Grant 9,234,934 - Nakanishi , et al. January 12, 2 | 2016-01-12 |
| Inspecting device and inspecting method Grant 9,151,669 - Ito , et al. October 6, 2 | 2015-10-06 |
| Inspection Apparatus And Inspection Method App 20150276607 - NAKANISHI; Hidetoshi ; et al. | 2015-10-01 |
| Inspection Apparatus And Inspection Method App 20150236642 - NAKANISHI; Hidetoshi ; et al. | 2015-08-20 |
| Inspection apparatus and inspection method Grant 9,103,870 - Nakanishi , et al. August 11, 2 | 2015-08-11 |
| Inspection Appratus And Inspection Method App 20150162872 - NAKANISHI; Hidetoshi ; et al. | 2015-06-11 |
| Inspection Apparatus And Inspection Method App 20150053869 - NAKANISHI; Hidetoshi ; et al. | 2015-02-26 |
| Photo Device Inspection Apparatus And Photo Device Inspection Method App 20150015297 - Nakanishi; Hidetoshi ; et al. | 2015-01-15 |
| Inspection apparatus and inspection method Grant 8,872,114 - Nakanishi , et al. October 28, 2 | 2014-10-28 |
| Inspecting Device And Inspecting Method App 20140253911 - Nakanishi; Hidetoshi ; et al. | 2014-09-11 |
| Inspecting Device And Inspecting Method App 20140239182 - ITO; Akira ; et al. | 2014-08-28 |
| Inspecting Device And Inspecting Method App 20140002125 - NAKANISHI; Hidetoshi ; et al. | 2014-01-02 |
| Inspection Apparatus And Inspection Method App 20130222004 - NAKANISHI; Hidetoshi ; et al. | 2013-08-29 |
| Inspection Apparatus And Inspection Method App 20130015368 - NAKANISHI; Hidetoshi ; et al. | 2013-01-17 |
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