loadpatents
name:-0.50789904594421
name:-0.025101900100708
name:-0.0016701221466064
Kawata; Yasuhiro Patent Filings

Kawata; Yasuhiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kawata; Yasuhiro.The latest application filed is for "semiconductor laser element and semiconductor laser device".

Company Profile
0.12.8
  • Kawata; Yasuhiro - Anan JP
  • KAWATA; Yasuhiro - Anan-shi JP
  • Kawata; Yasuhiro - Tokyo JP
  • Kawata; Yasuhiro - Gyoda JP
  • Kawata; Yasuhiro - Saga JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Semiconductor laser element and semiconductor laser device
Grant 9,735,548 - Harada , et al. August 15, 2
2017-08-15
Method of manufacturing semiconductor device
Grant 9,692,208 - Michiue , et al. June 27, 2
2017-06-27
Semiconductor Laser Element And Semiconductor Laser Device
App 20170093131 - HARADA; Susumu ;   et al.
2017-03-30
Methods of manufacturing semiconductor laser element and semiconductor laser device
Grant 9,553,425 - Harada , et al. January 24, 2
2017-01-24
Method Of Manufacturing Semiconductor Device
App 20160197456 - MICHIUE; Atsuo ;   et al.
2016-07-07
Semiconductor device and method of manufacturing semiconductor device
Grant 9,318,874 - Michiue , et al. April 19, 2
2016-04-19
Semiconductor Laser Element, Methods Of Manufacturing The Same And Semiconductor Laser Device
App 20160072257 - HARADA; Susumu ;   et al.
2016-03-10
Semiconductor laser device
Grant 9,225,146 - Masui , et al. December 29, 2
2015-12-29
Semiconductor laser element
Grant 8,995,492 - Masui , et al. March 31, 2
2015-03-31
Semiconductor Laser Device
App 20140204969 - MASUI; Shingo ;   et al.
2014-07-24
Semiconductor Laser Element
App 20140140362 - Masui; Shingo ;   et al.
2014-05-22
Semiconductor Device And Method Of Manufacturing Semiconductor Device
App 20100308445 - MICHIUE; Atsuo ;   et al.
2010-12-09
Memory testing method and memory testing apparatus
Grant 6,877,118 - Oshima , et al. April 5, 2
2005-04-05
Memory testing method and memory testing apparatus
App 20010052093 - Oshima, Hiromi ;   et al.
2001-12-13
Testing device for concurrently testing a plurality of semiconductor memories
Grant 5,604,756 - Kawata February 18, 1
1997-02-18
Apparatus for parallel operation of triport uninterruptable power source devices
Grant 5,237,208 - Tominaga , et al. August 17, 1
1993-08-17
Uninterruptible polyphase AC power supply
Grant 4,665,322 - Eishima , et al. May 12, 1
1987-05-12

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